Qmax Introduces V200, the ultimate in PCB Functional Test, with features that are only found only in high-end ATE systems. It offers In-Circuit Functional Test for component level / cluster tests, Card Edge functional test of PCBs with guided probe back tracking and Boundary Scan Tests for high density PCBs with PQFP, BGA and other high density chips.

* Up to 96, RAM based Hybrid channels for physical contact test.

* Unlimited number of virtual test pins for contact-less testing using boundary scan test.

* Programmable Time base from 100ns (10MHz) to 200 µs in 2000 steps.

* IEEE 1076 Standard VHDL based Test Program Library for SSI / MSI / LSI / VLSI Devices.

* In-Circuit Functional Test with auto compensation for any In-Circuit configurations of SSI / MSI / LSI / VLSI Devices.

* PythonTD Test language for Test Vector generation and expected output definition for both digital and analog signals.

* Card Edge functional test for Digital / Analog & Mixed signal PCBs

* Guide Probe back tracking for Card edge functional tests.

* Industry Standard Digital Simulator.

* Fault simulation and test coverage report.

* Fault dictionary for reduced or nil internal probing of PCBs

* User defined analog stimulus for QSM VI trace tests from 1MHz to 1Hz.

* Measurement of Resistance, Capacitance, Inductance, Voltage, Frequency and Pulse Width.

* Integrated Industry standard IEEE 1149.1 Boundary Scan for Board Level tests for latest generation PCBs with BGA and other high-density package devices where physical contact is not possible.