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QT-8200 8 MHz PCB repair and diagnostic system
Specifications

DIGITAL Test Capability
No of pins / Chennels:Basic 48 channels, expandable to 96 in steps of 16 channels, Desk Top Version.
:Further expandable with Mux option.
Sink / source:650mA per pin/ch sink/source capacity as per IDS-0053/1
RAM behind Pin/Channel: 8K x 4 bits RAM behind each pin / channel
Pattern Rate: 8MHz
Test Rate: Programmable from 250Hz to 8MHz
Drive Speed: 8MHz Data rate or 4 MHz Clock rate max.
Loops & Conditional Loops: 32,000 Iterations.
CRC Test: Real Data compared bit by bit at all locations.
Drive State: Hi, Low and Tristate Hybrid pin drivers detachable by user.
Drive High : 0 to +10V Programmable in steps of 40mV.
Drive Low : 0 to -10V Programmable in steps of 40mV.
Sense High : + / -10V, in steps of 80mV.
Sense Low : + / -10V, in steps of 80mV.
Sensor Threshold: Dual
Terminator : Programmable 100K to 50 E pull -up/Down. Voltage programmable from +/- 13V.
Guard / Flying channels : 8 channels programmable. Expandable upto 16 channels.
No. of Palettes : 2 sets of Drive levels and threshold levels
Functional Library : TTL, +5V & +12V CMOS, ECL, EIA, LSI, Linear devices; Mixed signal device, +3.3 volt logic device, user upgradable, >21,200 devices. Optional library support of over 1500 Russian devices.
 
S/W Features & Functions
Features & Functions:True Digital/Analog Device power-on Incircuit functional IC test, In circuit Unknown Device Identify
Loop Test, Board Learn/Compare Test, In-circuit Impedance/Resistance, Capacitance and Voltage Measurement
Automatic Circuit Compensation; Automatic pull-up/down for open collector and ECL ICs
Logic Analyzer display For failure analysis
3 Channels digital scope display, Multiple Test library
Interactive QSM-VI Signature Technique for general purpose PCB repair
Clear Pass/Fail indication for ease of use
On-line Design Rule Checker
Circuit Tracer (Option)
IDDE for test program generation (Option)
On-Line help function
Operating System: QT8200 Test and Diagnostic Software runs under Windows 95/98/ME.
Failure Data Display : Logic Timing Diagram/Waveform/clip status/Message Window (All four windows on single screen)
BUT POWER supply: Software controlled, auto on/off BUT power supply with 5 different voltage options of +5V with a max. of 25 Amps; -5V with a max. of 25 Amps; +12V with a max. of 13 Amps; -12V with a max. of 13 Amps; 3.3V with a max. of 25 Amps; subject to a max. output of 450W.
 
Analog Test Capability
Analog Test Methodology : Clip-on Analog Functional test
Analog Test Frequency: 4 MHz Maximum / 0.03125 Hz minimum.
No of Pins/Channels: Basic 3 channels (expandable to 6 channels ) with independent drive, receive and reference for each channel, which can be multiplexed to any of the 48/96 test channels available
DC Voltage: +/-13V, in steps of 7mV
Drive output Current: 250mA per pin/ch.
Max Input/output voltage: upto 26V
Pulse Width: 125 nanoseconds to 4 milli seconds.
Programmable Load: 50 Ohms to 100K ohms in 5 steps
DC stimulus: 8, programmable
Resolution: 12 bit ADC/DAC for each pin/channel.
Drive Pattern: User definable and standard waveform include sine, ramp, triangle, square etc or any DC voltage
RAM behind pin: 8K X 24 bit RAM behind each pin/channel.
Amplitude: 0.1V to 13V (Max 26 Vpp, Min Vpp 0.2)
Drive Source Impedence: Programmable in 5 steps
Drive current/voltage: +/- 250mA maximum / +/- 13 volt per Channel.
Composite Voltage: Programmable like a function generator
AC Stimulus & Response: Three Channels
Frequency: 0.03125 Hz to 4 MHz
Offset Voltage: +/- 13V DC
A.C.Voltage: 26V Peak-to-Peak
Composite Voltage: Peak AC Components plus DC components
 
QSM and VI Trace
Test Method: Qmax Signature Method or QSM and Standard VI Trace as universal test technique
Drive pattern:Sine Wave at
0.6V          High @6mA             Med@1.5mA            Low@0.3mA
1.0V          High @10mA           Med@2.5mA            Low@0.5mA
2.5V          High @25mA           Med@6.25mA          Low@1.25mA
8.0V          High @20mA           Med@4mA                Low@0.4mA
13V           High @6.5mA          Med@0.65mA          Low@0.065mA
Drive Frequency: 40Hz., 312Hz., 2.5KHz
Functions: Test Interpretation 1. Comparison (Pass/Fail) Modes:Linear/Non-Linear 2.Nodewise Percentage error 3. Dual Probe-Direct on-line "live" comparison mode; Configurable for use with Test fixture; able to detect any illegal shorts / open between any pins / nodes; Deviation and Occurrences failure report for effective failure analysis.
 
Clock Pin Termination
Terminating voltage:within +/- 13V
Programmable resistor range :50 Ohms, 200 Ohms, 1K, 10K and 100K.
 
Multimeter
Measurement Range:
Resistance : 10 Ohms to 1M Ohms
Capacitance : 200pF to 10000F
Voltage : +/-13V
Frequency:Upto 130 MHz
 
Digital Oscillosope
No. of channels: 3 (Single or multiple trace)
Resolution: 12 bit resolution
Amplitude: 0 to 13V (in 5 Ranges)
Time base: 160ms to 5 sec (40 samples per time base division)
Trigger : Auto, normal, single, positive or negative
Input Impedence: 50 Ohms to >5 MOhms (50 Ohms, 200 Ohms, 1K, 10K, 100K and Open)
Sampling Rate: 8 Mhz to 250 Hz (125 nsec to 4 msec)
Memory: 8K memory per channel.
 
ESD Damage Test
Drive Frequency :40 Hz, 312 Hz, 2.5 KHz.
Drive Voltage :0.6 Min to 13V Max.
Drive Current :0.065mA min @ 13V to 25 mA max@ 2.5V
 
General
Power Requirement:Auto-switchable with short-circuit protection. UI,VDE,CSA,BABT, CE MARK approved power supply unit. Equipment case is earthed.
Physical Dimension:560mm (W) X 540mm (D) X 310mm (H);Rittal, RiCase 6 U Cabinet
Weight:30 Kg.(net)
Standard Configuration:Basic System QT8200 - 4848/3 comes with 48 channels digital; 48 QSM VI channels and 3 analog channels. QT8200 interfaced to a host computer (PC/AT) via a custom interface card and cable. Optional USB Interface.
QT-8200
Overview
Features
Specifications
Applications
Highlights
User segments
 
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