Highlights
- Exclusively designed cabinet for Defence applications
- High performance, Reliable tester with programmable test speed & test voltages
- Vast Functional Test Library with 21,200+ devices including Digital & Analog ICs
- Library Support for Western & Russian (1,500+) technology IC Chips
- Clip-on Analog In-Circuit Functional IC test including Mixed Signal Devices, ICs
- In-Circuit Functional Test for Digital, Analog & Mixed Logic Devies ESD test
- TTL,CMOS
- ECL, EIA, LSI, 3V3
- Linear, 12V, Comparator, Regulator
- PECL, Tiny Logic, DTL
- LSIs including processors, controllers and peripheral ICs
- ADC & DAC
- In built Simulator for In-Circuit compensation
- Datalogger facility for device under test
- Dual trace facility for probes and clips
- Auto Guarding
- Automated Clock termination feature for clock sensitive devies
- 3 channel Digital scope facility
- Logic analyzer waveform display for failure confirmation
- Built in Signal generator
- Device data dictionary
- IC Identifier
- Cluster Testing
- Graphical test program generator for Digital, Analog, Mixed signal devices.
- Mixed logic testing through dual palettes
- Open/Short Test
- Board test Programming facility with conditional jumps on pass/fail
- In-Circuit parameter prompt for device failure confirmation
- In built R, C, V & F measurement capability
- Auto / Manual channel mapping facility for board functional test through card edge/fixtures
- Built in self-diagnostic facility for maintenance
- Modular system design for future upgradation
- Powerful Sequencer based hardware architecture
- Automatic internal pull-up/down for open collector and open emitter devices
- Board Learn / Compare mode results in increased board recovery rate
- Circuit tracing facility between any family/components through clips & probes
- Circuit Tracer software to create net lists for schematic generation / reverse engineering
- IDDE software for easy test program generation.
|
|
 |
|