| Digital Test Capability |
|---|
| No of i/o channel | : | 48 Channels expandable to 96 channels- Desk Top Version |
| | : | Further expandable with Mux option |
| Drive output Current | : | 650mA per pin / ch. |
| Pin Memory | : | 8K RAM behind each pin. Predict / Capture |
| Drive standards | : | Complies with International Defence Standards 00-53/1. |
| Slew Rate | : | 100V / s, + /- 10V. |
| Pin to Pin Skew | : | 20ns maximum. |
| Pattern Depth | : | 8K test vectors . |
| Pattern Rate | : | 0.5 MHz. |
| Strobe Rate | : | 0.5 MHz. |
| Clock Rate | : | 0.25 MHz ( Min Clock tick 0.5 MHz) |
| Test Rate | : | Programmable from 62.5Hz to 0.5 MHz. |
| Loops | : | 32K Iterations. |
| Conditional Loops | : | 32K Iterations. |
| Subroutine nesting | : | User selectable numbers of levels . |
| CRC Test | : | Real Data compared bit by bit with locations. |
| Drive States | : | Hi, Low and Tristate Hybrid pin drivers detachable by user. |
| Drive High | : | 0 to +10v Programmable in steps of 80mV |
| Drive Low | : | 0 to -10v Programmable in steps of 80 mV. |
| Sense High | : | +/-10v, 80mV accuracy |
| Sense Low | : | +/-10v, 80mV accuracy |
| Input impedance | : | 100K minimum |
| Sensor Threshold | : | Dual. |
| Terminator | : | Programmable 100K to 50 E pull up / Down Programmable value to +/- 13 V. |
| Guard / Flying channel | : | 8 channels programmable. Expandable to 16. |
| Functions | : | True Digital/Analog Device power-on In-circuit Functional IC Test; In-circuit Unknown Device Identify; Loop Test, Board Learn/Compare Test, In-circuit Impedance/Resistance, Capacitance and Voltage Measurement; Automatic circuit compensation; Automatic pull-up/down for open collector and ECL ICs; Logic Analyzer Display for failure analysis; Digital Scope display; Multiple Test Library; Interactive QSM VI Signature Technique for general purpose PCB repair; Clear pass/Fail indication for ease of use; On-line Design Rule Checker; Circuit Tracer (option); IDDE for test program generation (option); On-line help function. |
| DUT power supply | : | Software controlled automatic ON-OFF with manual override; +5V @ 7 Amps, -5V @ 0.5 Amps, +12V @ 2.5 Amps, -12V @ 0.7 Amps. |
| Measurements | : | R: up to 2M Ohms, C:100 pF- 10,000 microF V: + /- 13V DC |
| Failure data display | : | Logic Timing Diagram/Waveform / clip status/Message Window in single screen. |
| |
| Clock Terminator |
|---|
| Terminator | : | Programmable 100K to 50 Ohm. Pull up/ Down
Programmable voltage up to + / - 13 V. |
| |
| Analog Pin Electronics |
|---|
| Analog Test Methodology | : | Clip on Analog Functional test. |
| Analog Test Frequency | : | 0.0078 Hz. Minimum to 0.25 M Hz Maximum . |
| No of Pins/Channels | : | 3 (exp 6) independent Drive/Sense multiplexed to 48 (96). |
| DC Voltage | : | +/ -13 V. |
| Drive output Current | : | 250mA per pin / ch. |
| Max Input | : | 26V. |
| Input impedance | : | > 2 meg ohms. |
| Pulse Width | : | 2micro sec to 16 milli second. |
| Programmable Load | : | 50 Ohms, 200 Ohms, 1K, 10K and 100K: V up to +/-13V Programmable. |
| DC stimulus | : | 8 programmable |
| Resolution | : | 12 bits ADC/DAC for each channel. |
| Drive Pattern | : | User definable and standard waveform include sine, ramp, triangle, square etc. |
| Pin Memory | : | 8K RAM . This is used to store, drive or read signals from the pin under test. |
| Frequency | : | 0.25 Hz to 250 K Hz |
| Amplitude | : | 0.1 Volts to +/- 13 Volts Peak. |
| Drive Source Impedance | : | Programmable in 5 steps from 50 Ohms to 100k Ohms. |
| Function Generator | : | Can be used as a Function Gen. with max. amp of +/- 13v. |
| |
| QSM and VI Trace |
|---|
| DRC Check | : | Auto DRC check on Interactive / Board Learn / Test |
| Test Method | : | Qmax Signature Method (QSM) and Standard VI Trace as universal test technique. |
| Drive pattern | : | Sine wave at |
| | 2.5V High @25mA Med @ 6.25mA Low @ 1.25mA |
| | 8.0V High @20mA Med @ 4mA Low @ 0.4mA |
| | 13V High @6.5mA Med @ 0.65mA Low @0.065mA |
| Drive Frequencies | : | 40 Hz, 312 Hz, 2.5 KHz. |
| Test Methods/ Features | : | Test Interpretation 1: Comparison (Pass / Fail ) Modes : Linear / Non Linear
2: Node wise 3. Dual Probe . Direct on-line "live" comparison mode; Configurable for use with Test fixture;
able to detect any illegal shorts/open between any pins/nodes; Deviation and occurrences failure report for effective failure analysis.
Interactive live mode. Direct on-line comparison. On Screen Board layout Auto/ Manual of component Signature High speeds parallel
link for host PC/ Laptop with 32-bit interface. True adjacent pin short test.Quick compare test store. Built in component library.
Dual probe. Selectable voltage / Frequency ranges. No UUT power required |
| |
| Digital Oscilliscope |
|---|
| No of Channels | : | 3 ( Single or Multiple trace) |
| Resolution | : | 12 Bit Resolution . |
| Amplitude | : | 0-13 V ( In 5 Ranges ) |
| Time Base | : | 80 micro second to 9.6 milli second |
| Trigger | : | Auto, Normal, Single, positive or negative trigger |
| Input Impedance | : | 50 Ohms to > 5 M Ohms . |
| Sampling rate | : | 0.5 MHz to 1.9KHz |
| Memory | : | 8k memory per channel. |
| |
| ESD Damage Test |
|---|
| Drive Frequencies | : | 40 Hz, 312 Hz, 2.5 KHz. |
| Drive Voltages | : | 13 V Max. to 2.5 V Min. |
| Drive Current | : | 25mA Max. @ 2.5V to 0.065mA Min. @ 13V |
| Interface | : | 16 Bit PCI Parallel Interface to the host computer. |
| |
| Power |
|---|
| Power requirement | : | 110VAC @ 8A/220VAC @ 4A Auto-switchable with short-circuit protection. UI, VDE, CSA, BABT, CE MARK approved SMPS unit. |
| Physical Dimension | : | Approx. 47 cm (W) X 41.5 cm (D) x 29 cm (H). |
| Weight | : | Approx 30Kgs net. |