Features
Standard test library for TTL and CMOS logic families
Power ON true digital and analog functional testing in-circuit and out-circuit
Automatic Pass / Fail analysis for the device under test (DUT)
Unknown device idenification to findout unmarked devices
Loop test to isolate intermittently failing devices
In-circuit resistance and capacitance measurement
Automatic pull-up and pull-down resistors for multi-block device testing
Powerful in-built Short Circuit locator catering for 200 milliohms, 2 ohms and 20 ohms ranges
Automatic BUT power control
Powerful Waveform Display for comparision with the evaluation engine and the output
Versatile Clipstatus Display with voltage / dynamic impedance / label display
Comprehensive Data Display on demand for the device under test
Powerful board learning and testing for improved debugging of faulty boards
Card Edge Testing with the Powerful IDDE Software limited to digital devices
Powerful QSM techniuqe for improved coverage when the function of the device is not known
DEF 0053/1 compliance for the safe operating limits on backdriving
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