 |
Overview
- Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry,
where production testing of high pin count devices are involved and test time is critical
- High speed testing at 2 seconds for 2 million test combinations
- Can be interfaced to any type of test fixtures
- Multi-Site Test support for Strip or Multiple device test.
- 16 Opto Isolated digital outputs for handler interface, binning and PASS / FAIL indicators.
- 16 Opto Isolated Digital Inputs for Operator console and handler interface.
- Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers.
- Fast turnaround time to test new products.
|
|  |
|