Features
Panther II is a new generation Open / Short tester applied for Semiconductor Industry with whole new fleet of features that
makes the task reliable, complete and fast. It uses Force Current – Measure voltage to test opens, shorts, leaks and diode drops.
It uses the Learn from a Known Good Board and test against target device technique.
This reduces the time required to generate, otherwise, tedious test program generation.
Typical test time for a 500 pin BGA device in both forward and reverse bias conditions with 5 band comparators,
is estimated to be about 0.25 second test time. Its hardware compare makes instant PASS / FAIL resilts with very
less software overhead time for display and data log.
Optional Hardware can be ordered and configure for:
- In-Circuit Measurement of RLC values using 4/6 wire Kelvin measurements
- VI-Trace,
- A/c Stimulus for contact less open / short test
- RAM based PMU for Force Voltage - Measure Current OR Force Current - Measure Voltage
Standard Panther II:
 | It uses an ultra fast programmable current source. |
| The current is programmable from as low as few micro amps to 50 milli amps in three ranges and 13-bit resolution. |
| The voltage compliance (Voltage Clamp) is also programmable within between -2V and +7V in 13-bit resolution. |
| The time base is programmable from 1µs per test to 256µs per test in steps of 1µs. The time base can be 1µs, 2µs, 3µs, 4µs etc upto 256µs. |
| Programmable wait states per test pair pin is from zero to 255 wait states. A time base selection of 2µs and wait state selection of zero,
gives 2µs test time. Wait state selection of 1 gives 4µs test time, wait state of 2 gives 6µs and this is programmable for each test combination individually. |
| This means each test combination can have its own wait states allowing longer settling time for some pin pairs where required
and default zero wait states for other pin pairs to maximize the test time as whole. |
Programmable Hardware Comparators:
| Panther II has four comparators with their thresholds fully programmable in 13-bit resolution within 5v range and produces a 4-bit test result code for each test combination. |
| The user can choose to use one comparator for simple open / short application (2 band, 1 bit test result code), 2 comparators for open / diode (0.6v) / short
classification (3 band, 2 bit test result code), 3 comparators for open / high impedance or 1.2v diode/ diode (0.6v) / short (four band, 3 bit test result code) or even four comparators for open / high impedance or 1.2v
diode / diode (0.6v) / near short or diode (0.3v) / short (5 band, 4bit test result code) classifications. |
| Five-band comparison gives maximum information in a single test and allows device grading and checks out devices at threshold and pin-to-pin leakages that a normal OS tester
cannot detect or require multiple tests with different thresholds. |
| Panther II utilizes full hardware comparison so as to achieve fastest time for test. |
| It can accept open / short data entered by operator or a net-list import or can Learn from a known Golden Device. |
| By utilizing hardware compare the Go – NoGo test time is just the hardware drive time and it is the fastest. |
| For a full failure analysis (FA) it can give the complete failure information for up to 4 Mega test combinations from its acquisition RAM. |
| It also has the facility to store the first 8192 failures for an optimum Test and FA information retrieval Time. |
Four Wire Measurement MUX cards:
| Panther II uses 4-wire measurement using fast analog switches for accurate voltage measurements and improves accuracy. |
| Each Mux card holds 256 channels with 4-wire measurement capability. |
| Maximum of 8 MUX cards allowing 2048 channel system. |
Multiple Test Techniques:
Mode 1: Serial Shift Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device.
For a 208 pin device, no. of tests are 208.
Mode 2: Fixed Reference Method
In this mode, any pin can be made as fixed reference pin and all other pins are tested. Thus for a 14 pin device, 13 test will be carried out keeping any one of
the 14 pins as reference. Same pin as reference pin and test pin combination is skipped. The no. of combinations in this mode for 2048 pins are 2047 combinations.
Mode 3: Half QSM Method - n*(n-1)/2 combinations
In this mode, all combinations of pins are tested as pair by pair excluding reverse combinations. Same pin as reference pin and test pin combination is skipped.
Example, Pin 1 as ref and pin 2 to n are test pins, then pin 2 as ref, pins 3 to n as test pins. The no. of test combinations for this method with 2048 channels
are 2 Mega combinations.
Mode 4: Full QSM Method - n*(n-1) combinations
In this mode, all combinations of pins are tested as pair by pair including the reverse combinations. Example, Pin 1 as ref and pin 1 to n are test pins, then pin 2 as
ref and pins 1 to n as test pins (Same pin as reference pin and test pin combination is skipped). Thus in this mode both normal and reverse polarity combinations are
tested automatically. No. of test combinations for 2048 channels will be 4 Mega combinations
Mode 5: Ram Based select sequences.
In this mode, the required test pin / reference pin addresses have to be filled in the RAM and the tester does only those combinations.
The designed capacity for RAM based sequences are 4 MEGA combinations.
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