 | It uses an ultra fast programmable current source. |
| The constant current is programmable from as low as few micro amps to 50 milli amps in three ranges and 13-bit resolution. |
| The voltage compliance (Voltage Clamp) is also programmable within between -2V and +7V in 13-bit resolution. |
| The time base is programmable from 1µs per test to 256µs per test in steps of 1µs. Programmable wait states between zero to 255, used to extend the test time if required. |
| Panther 16K has two comparators with their thresholds fully programmable in 13-bit resolution between -10v to 10V and produces a 2-bit test result code for each test combination. |
| The user can choose to use one comparator for simple open / short application (2 band, 1 bit test result code), 2 comparators for open / diode / short
classification (3 band, 2 bit test result code) classifications. |
| Panther 16K utilizes full hardware comparison so as to achieve fastest time for test. |
| It can accept open / short data entered by operator or a net-list down load or can Learn from a known Golden Device. |
| By utilizing hardware compare the Go – NoGo test time is just the hardware drive time and it is the fastest. |
| For a full failure analysis (FA) it can give the complete failure information for up to 128 Mega test combinations from its acquisition RAM. |
| It also has the facility to store the first 8192 failures for an optimum Test and FA information retrieval Time. |
| Panther 16K uses 4-wire measurement using fast analog switches for accurate voltage measurements and improves accuracy. |
| Each Mux card holds 256 channels with 4-wire measurement capability. |