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Clips and Probes
Test interface to the Device Under Test (DUT) is the most important feature of an Automated Test Equipment (ATE) since this is one of the key factors, which determines testability of the Board/Device Under Test and it further, enhances the effectiveness of the ATE system.

Qmax offers a wide range of special sockets/Adaptors and Test Clips to provide interfacing to number of device packages and types, which are used internationally in the electronics industry. Be it a small micro grabber or special test clips for testing Russian technology ICs or special test adaptors for testing various SMD packages like QFP, PLCC, SOIC etc Qmax has the solution for your requirement. Qmax can even customise special test clips and sockets and Bed of Nails fixtures should you have any specific requirement.

These useful optional accessories cater to various application areas like Inward Goods Inspection (IGI), for the In/Out Circuit Functional Testing/Troubleshooting of your PCBs/Electronic modules as part of production/testing or PCB repair and Quality Assurance applications.

Out Board Special Device Test Adaptors

Solderside (Bottom access) Test Clips

Russian IC Test Clips

Test Clips for DIP Devices

Test Clips for SOIC SMD Devices

Test Clips for PLCC SMD Devices

Other Accessories for Testing

Special Russian Clips