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Location of Shorts using 4 wire Milli Ohm Meaurement |
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Detection Open / Shorts using Ohms Measurement
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QSM VI Function |
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User Defined VI patterns |
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Min / Max No. of QSM VI Channels |
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40 |
64-512 |
64-256 |
16-128 |
16-128 |
16-128 |
16-128 |
32-320 |
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Min / Max Voltage ranges in QSM Drive |
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2.5-32v |
2.5-32v |
2.5-13v |
2.5-32v |
1.0-13v |
1.0-13v |
0.6-13v |
0.6-13v |
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Min / Max Frequency of QSM |
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40-2500Hz |
40-2500Hz |
40-2500Hz |
40-2500Hz |
40-2500Hz |
1Hz to 100KHz |
40-2500Hz |
1Hz to 100KHz |
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Min / Max Source Impedance of QSM |
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330E-100K |
330E-100K |
330E-100K |
50E-100K |
50E-100K |
50E-100K |
50E-100K |
10E-1M |
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No. of Analog Channels |
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1 |
1 |
2 |
3 |
3 |
3 |
3 |
4 |
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Out Circuit Functional Test for Analog Devices (Library) |
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In-Circuit Functional Test for Analog Devices (Library) |
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ICFT for 5 volt devices |
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ICFT for +/- 12 Devices |
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Min / Max No .of Digital Channels |
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16-256 |
16-96 |
16-96 |
16-96 |
16-128 |
32-320 |
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Digital Drive Min / Max Logic High Levels |
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5v only |
0 to +10v |
0 to +10v |
0 to +10v |
0 to +10v |
0 to +7v / +10v |
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Digital Drive Min / Max Logic Low Levels |
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0v only |
0 to –10v |
0 to –10v |
0 to –10v |
0 to –10v |
0 to –2v / –10v |
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Digital Drive Source Capacity |
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220mA |
650mA |
650mA |
650mA |
650mA |
50mA / 650mA |
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Digital Drive Sink Capacity |
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220mA |
650mA |
250mA |
650mA |
650mA |
50mA / 650mA |
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Max Test Speed per Clock Tick |
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2µs |
2µs |
125ns |
100ns |
50ns |
50ns |
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Min Test Speed per Clock Tick |
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256µs |
4ms |
1ms |
16ms |
16ms |
16ms |
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Test Mixed Logic In-Circuit |
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Test Mixed Signal In-Circuit |
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BCSS Signature System |
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Power On Nodal Inpedance Test (NI) |
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Measure Resistance |
0-200E |
0-1 Meg |
0-1 Meg |
0-1 Meg |
0-1 Meg |
0-1 Meg |
0-1 Meg |
0-1 Meg |
1-10 Meg |
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Mesaure Capacitance |
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100pf - 5000mfd |
100pf - 5000mfd |
100pf - 5000mfd |
100pf - 5000mfd |
100pf - 5000mfd |
100pf - 10000µf |
100pf - 10000µf |
10pf - 10000µf |
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Measure Voltage |
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+/– 32v |
+/– 32v |
+/– 32v |
+/– 13v |
+/– 13v |
+/– 13v |
+/– 13v |
+/– 13v |
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Mesaure Frequecy |
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0 –120 MHz |
0 –120 MHz |
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0 –120 MHz |
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Ultra Fast Open / Short Test (1 us per test) |
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WorkStation / TestStation for QSM Software |
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WorkStation / TestStation for ICFT Software |
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WorkStation / TestStation for QT300 BCSS |
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Integrated Boundary Scan |
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TD2 Test Director |
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IDDE Option |
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CT Option |
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Operator Console |
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Board Level Functional Test |
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Guided Probe Back Tracking |
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VHDL Library Support |
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Fault Simulation |
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Fault Dictionary |
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Osilloscope and Function Generator |
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External PXI / IEEE Instrumentation |
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