QT8200
8 MHz Analog, Digital
& Mixed Signal
In-Circuit Functional Tester
CLICK
HERE FOR A DETAILED SPECIFICATIONS
Qmax QT8200 - 8 MHz Mixed
Signal In-Circuit Functional Tester
High Speed Mixed Signal In-Circuit Functional
Tester to test all types of Digital, Analog & Mixed devices like TTL,
CMOS, ECL, PECL, EIA and the latest 3.3V Logic devices.
Qmaxs QT8200 is setting the standards
in In-Circuit Functional PCB Test and Diagnostic systems. It comes with
a complete range of functions that are required for improved faults coverage
of almost any type of boards. Its powerful digital and analog in-circuit
power on functional test is most useful in troubleshooting faulty PCBs that
are populated with mixed signal devices. It can test devices such as Op-amps,
ADCs, DACs, Comparators etc., functionally under power-on condition by driving
the inputs with a complete test pattern and calculating the expected outputs
using its powerful evalution engine. In-Circuit Device Under Test (DUT)
pin interconnects are automatically taken care of by the software. Users
need only to key in the number of the DUT and QT8200 will automatically
test and provide a clear PASS or FAIL result. It provides a complete waveform
display for failure confirmation.
QT8200 provides the user with a Learn/Compare function that allows the user
to learn the DUT interconnect and test status. This information is used
during Test Comparison to enable the user to detect illegal open, shorts
or wrong impedance on the DUT. This is most helpful since circuit diagrams
are not usually available while testing the faulty PCBs. The powerful Graphical
Test Program Generation function allows the user to generate functional
tests for PALS, ROM and many unknown LSI / VLSI ICs. Circuit Tracer Function
allows the user to trace the circuit of a PCB and use a CAD software to
generate the schematic for documentation purpose or for reverse engineering.
QT8200 also comes with the QSM or Super V-I Technique. It is a very innovative
signature method that is developed by Qmax and can be used as a general
or universal test method. It is very effective on boards populated with
ASICs and unknown VLSI ICs and can be used as a QA tool. QSM can detect
DUT shorts, opens between any pins and functional failures up to a very
high degree using its unique signature method and without the need to write
complicated test program. QSM provides more fault coverage than simple in-circuit
component value measurement or the fixed reference VI.
HIGHLIGHTS
- Power-on true functional test for Digital,
Analog, Mixed Digital Logic and Mixed signal IC devices both in-circuit
and out-circuit mode.
- Vast library support and continuous updates
for standard TTL, CMOS, ECL, EIA, 3.3V, LSI, VLSI devices, Analog devices
such as Transistors, Op-amps, Comparators, DACs, ADCs etc., of about 19,000+.
- Easy DUT interface by clips, probes, custom
bed of nail fixture or X-Y prober.
- Functional testing of micro subassemblies
and printed circuit boards using Graphical Test Program Generator.
- Circuit Tracing and schematic generation
capability.
- Failure analysis and Quality Control applications
with QSM technology.
- Powerful and Simple test languages QDDL,
WEST and GTPG makes program development for new devices easy.
- Board / Device learn and test function.
- Logic analyser waveform display for Pass
/ Failure confirmation.
- Resistance, Capacitance, Voltage & Frequency
measurement using probe & Reference.
- Dynamic or static DUT power control.
- Three 12 bit analog channels with user defined
parameters. Can also be used as a programmable function generator.
- Compliance to International Defence Standards
INT. DEF. STAN. 00-53/1 for safe operating limits for backdriving.
- MS-Windows 95 / Windows 98 based for comprehensive
information, display and easy user interface.
- Effective from day one.
FEATURES
- Standard test library for TTL, CMOS, ECL,
PECL, EIA, 3.3V, LSI, 12V Logic families and linear devices
- Power ON true digital and analog functional
testing in-circuit and out-circuit
- Automatic Pass / Fail analysis for the device
under test
- Unknown device identification to find out
unmarked devices
- Loop test to isolate intermittently failing
devices
- Resistance, Capacitance, Voltage & Frequency
measurement using probe & Reference.
- Automatic pull-up and pull-down resistors
for multi-block device testing
- Powerful Waveform Display for comparison
with the evaluation engine and the output
- Versatile Clip status Display with voltage
/ dynamic impedance / label display
- Comprehensive Data Display on demand for
the device under test
- Powerful board learning and testing for
improved debugging of faulty boards
- Card Edge Testing with a powerful IDDE software
- Powerful QSM technique for improved coverage
when the function of the device is not known
- DEF 0053/1 compliance for the safe operating
limits on backdriving
SPECIFICATIONS
DIGITAL
- Basic 48 channels of digital drives supporting
2 palettes with independent
drive levels and thresholds, expandable to a maximum of 96 channels
- 650 mA sink / source per channel
- ±10V drive levels programmable in
steps of 80 millivolts
- Maximum 20 nanosecond skew between channels
- 8 MHz data rate or 4 MHz clock rate maximum
- 8192 deep by 2 bits RAM behind each pin
- Programmable time base to accommodate slower
devices
- 8 programmable guard channels
ANALOG
- 3 Analog channels can be connected to any
channels
- 12 bit resolution in 2.5V, 5V, 8V and 13V
ranges
- 8192 deep by 12 bits RAM behind each channel
- Selectable drive source impedance of 50
Ohm, 200 Ohm, 1K Ohm, 10K Ohm and 100K Ohm
- ±250 milli amps per channel
- Choose the drive pattern from sine, cos,
tan, square, triangular and
ramp with programable amplitude, phase and frequency
QSM
QSM is a proprietary test technique
developed by Qmax to effectively debug boards
with no information about the devices being used, but with a known good
board.
- User selectable voltage from 2.5V / 8V /
13V
- User selectable frequency 40Hz / 312Hz /
2500Hz
- User selectable current limit
RERAIR TROUBLE-SHOOTING
APPLICATIONS :
- PCB Repair tool for third party repair shops
- Small to medium volume production testing
- Card Edge Testing with the QT8200
CLICK
HERE FOR A DETAILED SPECIFICATIONS

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