QT8200

Specifications

Digital Test Capabilities

Drive / Sense channels	:	Basic 48, expandable upto 96 in steps of 16 channels per card.
Drive / Sink capability	:	650mA per ch. Back-driver complies with International Defence Standards 00-531.
Drive voltage levels	:	±10V programmable in steps of 40mV.
Sense Threshold	:	–10 to +10V programmable in steps of 80mV.
RAM behind each drive	:	8k x 2 RAM.
Test Speed	:	Programmable from a maximum of 125 nsec. to 4 milli sec. per tick in 16 steps. (8 MHz Data rate or 4 MHz Clock rate maximum)
Guard / Flying channel	:	8 channels expandable upto 16 channels programmable.
Diagnostic software	:	Qmax QT8200 WorkStation software runs under MS-Windows ’95 / 98.
Test Language	:	Qmax QT8200 IDDE software with QDDL, WEST language and GTPG. (Optional)
DUT power supply	:	+5V @ 7 Amps, –5V @ –0.5 Amps, +12V @ 2.5 Amps, –12V @ –0.7 Amps. Auto Switch on/off under program control.

Analog Test Capabilities

Drive / Sense channels	:	Basic 3 Analog Ch. expandable upto 6 Ch.max. multiplexed to any of the 48/96 Ch. and 2 sets of movable probes and references.
Drive / Sense capability	:	± 250mA max; ± 13V max.
RAM behind channels	:	8k x 2 RAM behind each drive and sense channels.
Resolution	:	12 bits
Test Speed	:	125 nsec. to 4 milli sec. per tick in 16 steps. (4 MHz max./ 0.0305 Hz min.)
Drive pattern	:	Sine, Ramp, Triangle, Square or user definable. QSM and VI Trace
Probes	:	2 probes with 2 reference signal inputs for QSM.
Drive pattern	:	Sine wave at 2.5V High @ 25mA                             Med @ 6.25mA                              Low @ 1.25mA 8.0V High @ 20mA          Med @ 4mA          Low @ 0.4mA 13V High @ 6.5mA         Med @ 0.65mA         Low @ 0.065mA
Frequencies	:	40 Hz, 312 Hz, 2.5 KHz.

Functional Features
Library : • Vast library for TTL, +5V & +12V CMOS, ECL, EIA, 3.3V Logic devices, DTL, INTERFACE, LSI, VLSI, Linear, Mixed Logic and Mixed Signal devices.
Capabilities : • In-Circuit Digital and Analog functional test • Auto clipping • Automatic circuit compensation • Unknown device Identification • Automatic pull-up / pull-down for open collector and open emitter testing • Loop test • Board learn / test functions with auto guarding guide • Multiple test libraries • In-Circuit Resistance / Capacitance / Voltage measurement • Power-on pin status indication for pin floats, links, voltages and impedance • Logic analyser waveform display • Clear PASS / FAIL indication for ease of use • On-line design rule checker • Variable test speed • Circuit Tracer function (Optional) • Integrated testing of ICFT, QSM / VI in one operation • Board functional test through card edge (Optional) • Cluster testing (Optional).
• Functional test for Op-Amps, Comparators, Diodes, Transistors, SCR, FETS and mixed signal devices in both in-circuit and out-circuit mode.
• QSM (movable reference), VI and adjacent pin reference techniques • Impedance and Voltage measurements • Auto device scan • Auto device compare.

Oscilloscope

No. of channels	:	3 (Single or multiple trace)
Resolution	:	12 bit resolution.
Amplitude	:	0 to 13 v (in 5 Ranges)
Time base	:	160 ms to 5 µsec (40 samples per time base division).
Trigger	:	Auto, normal, single, positive or negative.
Input Impedence	:	50 ohms to >5 Meg ohm. (50 ohms, 200 ohms, 1k, 10k, 100k and open).
Sampling Rate	:	8 MHz to 250 Hz. ( 125nsec to 4 msec).
Memory	:	8K memory per channel..

Measurement capabilities

Resistance	:	10 Ohms to 1 Meg.
Capacitance	:	100 pF — 10,000 µF.
Voltage	:	Upto ±13 volts
Frequency	:	Upto 130 MHz.

Physical Dimensions	:	520 mm (W) x 480 mm (D) x 210 mm (H). Weight : 18 kgs.
Power requirement	:	220v @ 2 Amp max. / 110v @ 4 Amp max.

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