The system consists of Card rack unit, BUT Interface unit, BUT Power supply and current measurement unit and Computer Interface card.
Computer Interface :
16 bit PCI Zero Wait State parallel interface to the host computer PCI slot.
Card Rack Unit :
System consists of basic 10-slot card rack Interfaced to the host computer for support upto 128 Digital Channels, 8 flying channels, ultra fast open / short tester, 3 Analog Channels with 12 bit resolution. When used with Channel Multiplexer the 128 digital channels can be increased to 1024 channels. Can be further expanded to 20-slot card rack to support 2048 channels.
BUT Interface :
Front panel Euro connectors for usage of Clips and probes, when used without Channel Multiplexer.
Front / Side panel Euro connectors for fixture Interface when used with Channel Multiplexer.
BUT power controlled by system. +5v @ 8 amps, +12v @ 2 amps, –12v @ 0.5 amps and –5v @ 0.5 amps standard. Can be ordered with –5.2v @ 8 amps if required at additional cost for testing ECL device boards.
Operator Interface :
3 button operator console or foot–switch option.
Open / Short Test :
Open / Short test for upto 128 channels without Channel Multiplexer option or upto 1024 channels with 1:8 Channel Multiplexer option. Fastest test time per pin pair is 0.5 µs. Test threshold programmable from 2 ohms to 1K ohms. This is a power off test and the applied current is programmable from 0-50ma current source. Maximum voltage applied is 0.2 volts.
Measurements :
Measure R from 10 ohms to 2 M Ohms with active guarding.
Measure C from 100 PF to 10,000 µF with active guarding.
Measure L from 10 µH to 100 mH with active guarding.
Measure V from 1 mV to 13 V.
Measure F from 1 Hz to 130 MHz, Trigger threshold variable by software from – 10v to +10v in steps of 80 milli-volts.
Signal amplitude of Frequency upto +/–15 volts.
QSM VI Test :
Movable reference QSM VI curve tracing Voltage range: +/– 0.5v / +/– 1v / +/– 2.5v / +/– 5v / +/– 8v and
+/– 13v. Frequency: 10 Hz, 100 Hz, 1KHz, 5 KHz and 10 KHz. Current range: 6 µAmps to 260 mA Multiplex to 128 basic channels without Channel Multiplexer OR upto 1024 Channels with Channel Multiplexer Option.
Digital Functional Test :
16 Digital Channels per card. Maximum 8 cards in basic card rack.
Pull-up / Pull-down programmable for each channel, typically 2.2 K. Upto 1024 Digital Channels with Channel Multiplexer option. Functional Test using Clips/Flying probes/Fixture/Card Edge connectors.
Optional Pin Electronics :
1) High Speed Pin Driver / Receiver.
50 ohms output impedance, 7.5v raise in 5 ns, Drive speed programmable from 20 MHz.
Two Drive Pallets of user programmable in the range of +8v / – 2v in steps of 40 milli-volts.
Receive threshold programmable in steps of 5 mill-volts and in the range of +/– 10v. Two simultaneous Drive and Threshold Pallets.2) In-Circuit Force Driving Pin Drivers.
Source / sink current upto 500 m.a.
+/–10 Drive levels programmable in steps of 40 mill-volts.
Drive speed programmable from 100 ns per tick in 10 MHz version.
Drive speed programmable from 500 µs per tick in 2 MHz version.3) Programmable Current source / sink option
50mA and 5mA ranges. 256 step programmable from 0-50mA in 50mA range and 0-5mA in 5mA range. Inhibit on the fly mode mode. Useful as active load in testing semiconductor output pins
Analog Pin Electronics :
3 channels with 12 bit DAC and ADC at sampling speeds of up to 20 Mega samples per second.
Voltage ranges : 0.5v, 1v, 2.5v, 5v, 8v and 13v.
Programmable source impedance : 50 ohms, 200 ohms, 1k, 10k and 100k and Open (No drive)
Wave form : DC / Sine / Square / Triangle / Ramp.
The three analog channels are multiplexable to any of the fixture channels.
Flying Channel support :
8 Flying channels capable of driving / receiving Digital / Analog signals. Can also be used for Digital Guarding.
Probes :
2 probes and 2 references for discrete measurements / Pin Finder etc.
Relay Tester option :
Optional Card for testing relays upto +/-36 volts coil voltage / 4 sets of contact resistance measurement units, Drop in / Drop out voltage readings, Coil impedance measurement, Coil current measurement, Life Cycle test.
Bus Cycle Signature System :
Optional Bus Cycle Signature system for Real Time Functional CPU based board testing using Learn and compare technique without having to write test programs.
System Mounting :
Table Top system without Channel Multiplexer.
Mounted under the table in Channel Multiplexer option System.
