|
|
SYSTEM
| Test Points | : | Up to 96 Digital In-Circuit Testing (16 Ch. per card). Up to 96 Analogue In-Circuit Testing Un-limited Virtual Test points |
| Pattern Rate | : | 10 MHz - Digital testing (Maximum), 10 MHz - Analogue testing, (20 MHz sampling rate) 100 KHz - QSM VI |
| Time Base | : | Programmable from 10ns to 200µs in steps of 100ns (2000 steps). |
| Dynamic Guarding | : | Up to 16 channels, allocated automatically. |
| UUT Programmable Power Supply ( Optional ) | : | Software controlled power supply with max. Voltage upto 20V and max. current of 10A. Also optionally available 6V/33A; 10V/20A; 36V/6A and 60V/3.5A |
| |
DRIVERS / SENSOR
| DIGITAL |
| Driver/Sensor card | : | 16 channels bi-directional RAM based channel / card up to 96 max |
| Drive Level and Resolution | : | +/– 10V programmable in 80mV steps |
| Sense Level and Resolution | : | +/-10V programmable in 40mV steps. |
| Current | : | 650 mA sink & source limit. |
| Drive state | : | Hi, Low and Tri-state. |
| Conditional loops | : | 32,000 Iterations |
Next
| ANALOG |
| No. of Channels | : | Three - 12 bit DAC / ADC RAM based. |
| Analog Multiplexer | : | Switchable to any test channel available |
| Drive output current | : | 250 mA per pin / ch. |
| Drive pattern | : | User definable and standard waveform |
| Drive Source Impedance | : | Programmable in 5 steps |
| Drive current / voltage | : | +/- 250 mA maximum / +/- 13 Volt per Channel. |
IN-CIRCUIT TEST
| Digital | : | Clip-on test using system's device library and simulator output. |
| Analog | : | Clip-on test using system's device library and simulator / calculated output. |
| SIMULATOR | : | Qmax Simulator - standard Industry grade VHDL simulator - optional (ModelSim). |
| |
OTHER FEATURES
| Size of test | : | 8K-deep test vectors in single burst mode. Unlimited vector depth in interactive hand shake mode. |
| Analog Measurements1 | : | DMM - R,L,C,V and F Three Channel Oscilloscope with programmable load. |
| ESD test | : | 0.065 mA min @13V to 25mA max @ 2.5 V at 2.5KHz. |
| Dual Signature trace | : | Standard feature.Signature plotting through two probes or set of Clips. |
| On board Clock disable H/W | : | Disable clock disturbance while testing In-circuit. |
| |
Next
TEST SOFTWARE
| TDII Interactive Workstation | : | Standard. |
| TDII TestSequencer | : | Standard. |
| TDII TestStation | : | Standard. |
| TDII Basic TPS Development Studio | : | Optional. |
| TDII Advanced TPS Development Studio with Digital VHDL Simulator | : | Optional. |
| CircuitTracer for Reverse engineering | : | Optional. |
| Edwin for windows 2000 for schematic generation | : | Optional. |
| Basic Boundary Scanning S/W | : | Optional. |
| Advanced Boundary Scan Test | : | Optional. |
| ISP - JTAG for flash programming | : | Optional. |
| |
GENERAL
| Recommanded Controller | : | Pentium PC. |
| Recommanded O.S. | : | Windows 2000. |
| Interface | : | USB 2.0 / PCI card. |
| User Control | : | keyboard / Mouse / Optional- Foot switch / external trigger. |
| Test Interface | : | Clips - Probes / Card edge / customized test fixtures / J- Tag. |
| |
|
|