|
|
A whole new
definition for ATE |
 |
|
V200
is a cost effective mini ATE system, designed to cater the needs of PCB Test and repair depots, keeping in mind the
changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic
functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FBGA VLSI chips.
It is a Combinational - Mixed Signal Test System with the addition of Boundary Scan Test for Latest generation of Chips.
It has Card Edge Functional Test for both digital and analog, In-Circuit Functional Test for Localized test of Individual
devices including LSI / VLSI / Memory and Microprocessors. It also incorporates an Advanced QSM VI with user definable wave pattern.
|
Features of V200 Hardware:
V200 is designed as a Combinational Tester with Digital / Analog and Mixed Signal Test capabilities through simple Clips and
probes or through card edge or as a cluster tester with a special test fixture for up to 96 test pins. In addition it has the
Boundary Scan Test option for virtual test where the number of virtual test pin has no physical limit. Its basic timing unit is
100ns and thus can generate test patterns at 10 MHz data rate. The timing units are programmable in 2000 steps from 100ns to 200µs,
(100ns, 200ns, 300ns etc up to 200µs) thus allowing accurate pattern timings. It has 8K X 4 RAM behind each digital pin
electronics and 8K X 24 RAM behind every analog channel. Its advanced sequencer allows external event synchronization or
handshake, which are very essential in complex microprocessor tests.
|
|
|