DIGITAL Test Capability
No of pins / Chennels	:	Basic 48 channels, expandable to 96 in steps of 16 channels, Desk Top Version.
	:	Further expandable with Mux option.
Sink / source	:	650mA per pin/ch sink/source capacity as per IDS-0053/1
RAM behind Pin/Channel	:	8K x 4 bits RAM behind each pin / channel
Pattern Rate	:	8MHz
Test Rate	:	Programmable from 250Hz to 8MHz
Drive Speed	:	8MHz Data rate or 4 MHz Clock rate max.
Loops & Conditional Loops	:	32,000 Iterations.
CRC Test	:	Real Data compared bit by bit at all locations.
Drive State	:	Hi, Low and Tristate Hybrid pin drivers detachable by user.
Drive High	:	0 to +10V Programmable in steps of 40mV.
Drive Low	:	0 to -10V Programmable in steps of 40mV.
Sense High	:	+ / -10V, in steps of 80mV.
Sense Low	:	+ / -10V, in steps of 80mV.
Sensor Threshold	:	Dual
Terminator	:	Programmable 100K to 50 E pull -up/Down. Voltage programmable from +/- 13V.

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Guard / Flying channels	:	8 channels programmable. Expandable upto 16 channels.
No. of Palettes	:	2 sets of Drive levels and threshold levels
Functional Library	:	TTL, +5V & +12V CMOS, ECL, EIA, LSI, Linear devices; Mixed signal device, +3.3 volt logic device, user upgradable, >21,200 devices. Optional library support of over 1500 Russian devices.
S/W Features & Functions
Features & Functions	:	True Digital/Analog Device power-on Incircuit functional IC test, In circuit Unknown Device Identify
		Loop Test, Board Learn/Compare Test, In-circuit Impedance/Resistance, Capacitance and Voltage Measurement
		Automatic Circuit Compensation; Automatic pull-up/down for open collector and ECL ICs
		Logic Analyzer display For failure analysis
		3 Channels digital scope display, Multiple Test library
		Interactive QSM-VI Signature Technique for general purpose PCB repair
		Clear Pass/Fail indication for ease of use
		On-line Design Rule Checker
		Circuit Tracer (Option)
		IDDE for test program generation (Option)
		On-Line help function

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Operating System	:	QT8200M Test and Diagnostic Software runs under Windows 95/98/ME.
Failure Data Display	:	Logic Timing Diagram/Waveform/clip status/Message Window (All four windows on single screen)
BUT POWER supply	:	Software controlled, auto on/off BUT power supply with 5 different voltage options of +5V with a max. of 25 Amps; -5V with a max. of 25 Amps; +12V with a max. of 13 Amps; -12V with a max. of 13 Amps; 3.3V with a max. of 25 Amps; subject to a max. output of 450W.
Analog Test Capability
Analog Test Methodology	:	Clip-on Analog Functional test
Analog Test Frequency	:	4 MHz Maximum / 0.03125 Hz minimum.
No of Pins/Channels	:	Basic 3 channels (expandable to 6 channels ) with independent drive, receive and reference for each channel, which can be multiplexed to any of the 48/96 test channels available
DC Voltage	:	+/-13V, in steps of 7mV
Drive output Current	:	250mA per pin/ch.
Max Input/output voltage	:	upto 26V
Pulse Width	:	125 nanoseconds to 4 milli seconds.

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Programmable Load	:	50 Ohms to 100K ohms in 5 steps
DC stimulus	:	8, programmable
Resolution	:	12 bit ADC/DAC for each pin/channel.
Drive Pattern	:	User definable and standard waveform include sine, ramp, triangle, square etc or any DC voltage
RAM behind pin	:	8K X 24 bit RAM behind each pin/channel.
Amplitude	:	0.1V to 13V (Max 26 Vpp, Min Vpp 0.2)
Drive Source Impedence	:	Programmable in 5 steps
Drive current/voltage	:	+/- 250mA maximum /+/- 13 volt per Channel.
Composite Voltage	:	Programmable like a function generator
AC Stimulus & Response	:	Three Channels
Frequency	:	0.03125 Hz to 4 MHz
Offset Voltage	:	+/- 13V DC
A.C.Voltage	:	26V Peak-to-Peak
Composite Voltage	:	Peak AC Components plus DC components

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QSM and VI Trace
Test Method	:	Qmax Signature Method or QSM and Standard VI Trace as universal test technique
Drive pattern	:	Sine Wave at
		0.6V          High @6mA             Med@1.5mA            Low@0.3mA
		1.0V          High @10mA           Med@2.5mA            Low@0.5mA
		2.5V          High @25mA           Med@6.25mA          Low@1.25mA
		8.0V          High @20mA           Med@4mA                Low@0.4mA
		13V           High @6.5mA          Med@0.65mA          Low@0.065mA
Drive Frequency	:	40Hz., 312Hz., 2.5KHz
Functions	:	Test Interpretation 1. Comparison (Pass/Fail) Modes:Linear/Non-Linear 2.Nodewise Percentage error 3. Dual Probe-Direct on-line "live" comparison mode; Configurable for use with Test fixture; able to detect any illegal shorts / open between any pins / nodes; Deviation and Occurrences failure report for effective failure analysis.

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Clock Pin Termination
Terminating voltage	:	within +/- 13V
Programmable resistor range	:	50 Ohms, 200 Ohms, 1K, 10K and 100K.
Multimeter
Measurement Range:
Resistance	:	10 Ohms to 1M Ohms
Capacitance	:	200pF to 10000F
Voltage	:	+/-13V
Frequency	:	Upto 130 MHz
Digital Oscillosope
No. of channels	:	3 (Single or multiple trace)
Resolution	:	12 bit resolution

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Amplitude	:	0 to 13V (in 5 Ranges)
Time base	:	160ms to 5 sec (40 samples per time base division)
Trigger	:	Auto, normal, single, positive and negative
Input Impedence	:	50 Ohms to >5 MOhms (50 Ohms, 200 Ohms, 1K, 10K, 100K and Open)
Sampling Rate	:	8 Mhz to 250 Hz (125 nsec to 4 msec)
Memory	:	8K memory per channel.
ESD Damage Test
Drive Frequency	:	40 Hz, 312 Hz, 2.5 KHz.
Drive Voltage	:	0.6 Min to 13V Max.
Drive Current	:	0.065mA min @ 13V to 25 mA max@ 2.5V
General
Power Requirement	:	Ac input - 220V @ 4Amps / 110V@8Amps.Auto-switchable with short-circuit protection. UI,VDE,CSA,BABT, CE MARK approved power supply unit. Equipment case is earthed.
Physical Dimension	:	675mm (W) X 565mm (D) X 480mm (H) including Vibration arresting pads.
Weight	:	62 Kg.(approx.)
Standard Configuration	:	Basic System QT8200M - 4848/3 comes with 48 channels digital; 48 QSM VI channels and 3 analog channels. QT8200M interfaced to a host computer (PC/AT) via a custom interface card and cable. Optional USB Interface.