High performance, Reliable tester with programmable test speed & test voltages

Vast Functional Test Library with 21,200+ devices including Digital & Analog ICs

Library Support for Western & Russian (1,500+) technology IC Chips

Clip-on Analog In-Circuit Functional IC test including Mixed Signal Devices, ICs

In-Circuit Functional Test for Digital, Analog & Mixed Logic Devies ESD test

TTL,CMOS

ECL, EIA, LSI, 3V3

Linear, 12V, Comparator, Regulator

PECL, Tiny Logic, DTL

LSIs including processors, controllers and peripheral ICs

ADC & DAC

In built Simulator for In-Circuit compensation

Datalogger facility for device under test

Dual trace facility for probes and clips

Auto Guarding

Automated Clock termination feature for clock sensitive devies

3 channel Digital scope facility

Logic analyzer waveform display for failure confirmation

Built in Signal generator

Device data dictionary

IC Identifier

Cluster Testing

Graphical test program generator for Digital, Analog, Mixed signal devices.

Mixed logic testing through dual palettes

Next

Open/Short Test

Board test Programming facility with conditional jumps on pass/fail

In-Circuit parameter prompt for device failure confirmation

In built R, C, V & F measurement capability

Auto / Manual channel mapping facility for board functional test through card edge/fixtures

Built in self-diagnostic facility for maintenance

Modular system design for future upgradation

Powerful Sequencer based hardware architecture

Automatic internal pull-up/down for open collector and open emitter devices

Board Learn / Compare mode results in increased board recovery rate

Circuit tracing facility between any family/components through clips & probes

Circuit Tracer software to create net lists for schematic generation / reverse engineering

IDDE software for easy test program generation.