Digital Test Capability
No of i/o channel	:	48 Channels expandable to 96 channels- Desk Top Version
	:	Further expandable with Mux option
Drive output Current	:	650mA per pin / ch.
Pin Memory	:	8K RAM behind each pin. Predict / Capture
Drive standards	:	Complies with International Defence Standards 00-53/1.
Slew Rate	:	100V / s, + /- 10V.
Pin to Pin Skew	:	20ns maximum.
Pattern Depth	:	8K test vectors .
Pattern Rate	:	0.5 MHz.
Strobe Rate	:	0.5 MHz.
Clock Rate	:	0.25 MHz ( Min Clock tick 0.5 MHz)
Test Rate	:	Programmable from 62.5Hz to 0.5 MHz.
Loops	:	32K Iterations.
Conditional Loops	:	32K Iterations.
Subroutine nesting	:	User selectable numbers of levels .
CRC Test	:	Real Data compared bit by bit with locations.
Drive States	:	Hi, Low and Tristate Hybrid pin drivers detachable by user.
Drive High	:	0 to +10v Programmable in steps of 80mV
Drive Low	:	0 to -10v Programmable in steps of 80 mV.

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Sense High	:	+/-10v, 80mV accuracy
Sense Low	:	+/-10v, 80mV accuracy
Input impedance	:	100K minimum
Sensor Threshold	:	Dual.
Terminator	:	Programmable 100K to 50 E pull up / Down Programmable value to +/- 13 V.
Guard / Flying channel	:	8 channels programmable. Expandable to 16.
Functions	:	True Digital/Analog Device power-on In-circuit Functional IC Test; In-circuit Unknown Device Identify; Loop Test, Board Learn/Compare Test, In-circuit Impedance/Resistance, Capacitance and Voltage Measurement; Automatic circuit compensation; Automatic pull-up/down for open collector and ECL ICs; Logic Analyzer Display for failure analysis; Digital Scope display; Multiple Test Library; Interactive QSM VI Signature Technique for general purpose PCB repair; Clear pass/Fail indication for ease of use; On-line Design Rule Checker; Circuit Tracer (option); IDDE for test program generation (option); On-line help function.
DUT power supply	:	Software controlled automatic ON-OFF with manual override; +5V @ 7 Amps, -5V @ 0.5 Amps, +12V @ 2.5 Amps, -12V @ 0.7 Amps.
Measurements	:	R: up to 2M Ohms,       C:100 pF- 10,000 microF        V: + /- 13V DC
Failure data display	:	Logic Timing Diagram/Waveform / clip status/Message Window in single screen.
Clock Terminator
Terminator	:	Programmable 100K to 50 Ohm. Pull up/ Down Programmable voltage up to + / - 13 V.

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Analog Pin Electronics
Analog Test Methodology	:	Clip on Analog Functional test.
Analog Test Frequency	:	0.0078 Hz. Minimum to 0.25 M Hz Maximum .
No of Pins/Channels	:	3 (exp 6) independent Drive/Sense multiplexed to 48 (96).
DC Voltage	:	+/ -13 V.
Drive output Current	:	250mA per pin / ch.
Max Input	:	26V.
Input impedance	:	> 2 meg ohms.
Pulse Width	:	2micro sec to 16 milli second.
Programmable Load	:	50 Ohms, 200 Ohms, 1K, 10K and 100K: V up to +/-13V Programmable.
DC stimulus	:	8 programmable
Resolution	:	12 bits ADC/DAC for each channel.
Drive Pattern	:	User definable and standard waveform include sine, ramp, triangle, square etc.
Pin Memory	:	8K RAM . This is used to store, drive or read signals from the pin under test.
Frequency	:	0.25 Hz to 250 K Hz
Amplitude	:	0.1 Volts to +/- 13 Volts Peak.
Drive Source Impedance	:	Programmable in 5 steps from 50 Ohms to 100k Ohms.
Function Generator	:	Can be used as a Function Gen. with max. amp of +/- 13v.

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QSM and VI Trace
DRC Check	:	Auto DRC check on Interactive / Board Learn / Test
Test Method	:	Qmax Signature Method (QSM) and Standard VI Trace as universal test technique.
Drive pattern	:	Sine wave at
		2.5V       High @25mA       Med @ 6.25mA       Low @ 1.25mA
		8.0V       High @20mA       Med @ 4mA            Low @ 0.4mA
		13V       High @6.5mA       Med @ 0.65mA       Low @0.065mA
Drive Frequencies	:	40 Hz, 312 Hz, 2.5 KHz.
Test Methods/ Features	:	Test Interpretation 1: Comparison (Pass / Fail ) Modes : Linear / Non Linear 2: Node wise 3. Dual Probe . Direct on-line "live" comparison mode; Configurable for use with Test fixture; able to detect any illegal shorts/open between any pins/nodes; Deviation and occurrences failure report for effective failure analysis. Interactive live mode. Direct on-line comparison. On Screen Board layout Auto/ Manual of component Signature High speeds parallel link for host PC/ Laptop with 32-bit interface. True adjacent pin short test.Quick compare test store. Built in component library. Dual probe. Selectable voltage / Frequency ranges. No UUT power required

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Digital Oscilliscope
No of Channels	:	3 ( Single or Multiple trace)
Resolution	:	12 Bit Resolution .
Amplitude	:	0-13 V ( In 5 Ranges )
Time Base	:	80 micro second to 9.6 milli second
Trigger	:	Auto, Normal, Single, positive or negative trigger
Input Impedance	:	50 Ohms to > 5 M Ohms .
Sampling rate	:	0.5 MHz to 1.9KHz
Memory	:	8k memory per channel.
ESD Damage Test
Drive Frequencies	:	40 Hz, 312 Hz, 2.5 KHz.
Drive Voltages	:	13 V Max. to 2.5 V Min.
Drive Current	:	25mA Max. @ 2.5V to 0.065mA Min. @ 13V
Interface	:	16 Bit PCI Parallel Interface to the host computer.

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Power
Power requirement	:	110VAC @ 8A/220VAC @ 4A Auto-switchable with short-circuit protection. UI, VDE, CSA, BABT, CE MARK approved SMPS unit.
Physical Dimension	:	Approx. 47 cm (W) X 41.5 cm (D) x 29 cm (H).
Weight	:	Approx 30Kgs net.