QT100-X
QT100X - Test-Pro Troubleshooter
QT100X is a Desk-Top Entry Level In-Circuit Functional Tester for Test & Repair of populated PCBs. It is capable of testing any 5V Logic device functionally in as wired “in-circuit” condition using vast Qmax device library. No matter, what in-circuit configuration of the device under test is, Qmax’s innovative auto compensation technique modifies the test vector to suit the device configuration on the fly. QT100X uses the back-driving or node-forcing technique to functionally test devices in-circuit. The in-built Auto Guarding Guide helps user to isolate those bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.QT100X also offers QSM VI (Qmax Signature Method - VI) technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI helps to detect ESD induced failures and also enhances fault coverage using Moving Reference technique.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and is stored for future reference. A faulty board of identical type can be compared with the learnt board under Board Test.
QT100X provides the facility to create a visual board layout on the screen.
QT100X has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms, 2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
QT100X offers Resistance, Capacitance, Voltage (RCV) Measurement facility alongwith two channel oscilloscope.
QT100X can be interfaced to any PC with Windows-XP (or higher version) Operating System using USB 2.0.
Key Features
- In-Circuit and Out of Circuit - Digital Functional Testing.
- Auto Guarding – For testing Bus Based devices In-circuit.
- Auto compensation with Qmax Simulator.
- Identify unknown or house coded devices.
- Loop test to isolate intermittently failing devices.
- Automatic Pull-up / down for OC / OE devices.
- Automatic BUT Power Control.
- Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
- Automatic Design Rule Checker for warning on illegal links / configurations of the device under test.
- Capable of testing Analog and Mixed Signal devices out of circuit.
- Logic Analyzer- waveform display for Input / Output Signals.
- Card Edge Testing with optional IDDE Software.
- Board Learn & Board Test Modes.
- QSM VI – an advanced tool for failure analysis.
- Circuit Tracing – For generating net list Information (Optional).
- IDDE - For developing new device program (Optional).
- Built-in Shorts Locator, RCV Measurements & Oscilloscope Functions.
CircuitTracer
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Basic Configuration : 48 digital, 64 QSM Channels.
Expandable : Up to 256 channels for both Digital and QSM Channels.
Expandable : Up to 256 channels for both Digital and QSM Channels.
Applications
- General purpose PCB test and diagnostics.
- Locating shorts across VCC – GND, between PCB tracks, Shorted or partially shorted devices on a bus.
- Testing of customized devices and discrete components using QSM VI.
- Schematic generation using Circuit Trace for un documented PCBs.
User Segments
- Electronic Manufacturing Service (EMS) providers for board recovery.
- Electronic PCB repair shops.
- R & D Labs.
- Educational Institutes in teaching Test Engineering Subject.
QT1100 - Test-Pro Troubleshooter
QT1100 is capable of testing any 5v Logic device functionally in as wired “in-circuit” condition using a huge Vast library that defines the functionality of the device in QDDL hardware description language with pre-defined test vectors. No matter what in-circuit configuration is the device under test is, Qmax’s innovative auto compensation modifies the test vector to suit the device configuration on the fly and its evaluation engine validates each output for the corresponding input present and device functionality. QT1100 uses the back-driving or node-forcing technique to functionally test devices in-circuit. Its Auto Guarding Guide helps user to isolate those Bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.QT1100 also offers QSM VI technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI captures traces by driving a user Selected current limited sine wave between any two nodes of the DUT and plotting the voltage Vs. current trace. For enhanced fault coverage, QSM VI is capable of capturing traces with any of the DUT pins kept as the reference pin. QSM VI helps detect ESD induced failures.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and store in a database file for the future use. A faulty board of identical type can be compared with the learnt board using the Board Test Mode, thus increasing the fault coverage. QT1100 provides the facility to create a visual board layout on the screen.
QT1100 has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
The built-in Resistance, Capacitance, Voltage (RCV) Measurement mode is capable of measuring RCV values using Probe and Reference pins. QT1100 is also equipped with two channel oscilloscope with maximum sampling rate of 500 KHz. The trigger options include auto, normal, single, positive and negative trigger.
Key Features
- In-Circuit and Out of Circuit - Digital Functional Testing.
- Auto Guarding – For testing Bus Based devices In-circuit.
- Auto compensation with Qmax Simulator.
- Identify unknown or house coded devices.
- Loop test to isolate intermittently failing devices.
- Automatic Pull-up / downs for OC / OE devices.
- Automatic BUT Power Control.
- Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
- Automatic Design Rule Checker for warning on illegal links / configurations of the device under test.
- Capable of testing Analog and Mixed Signal devices out of circuit.
- Logic Analyzer- waveform display for Input / Output Signals.
- Card Edge Testing with optional IDDE Software.
- Board Learn & Board Test Modes.
- QSM VI – an advanced tool for failure analysis.
- Circuit Tracing – For generating net list Information.
- IDDE - For developing New Device Program.
- Built in Shorts Locator.
- RCV Measurements & Oscilloscope Functions built in.
CircuitTracer
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is also an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices.using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is also an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices.using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Basic 48 digital , 64 QSM Channels , expandable up to 128 Channels for both Digital and QSM Channels in QT1100.
Applications
- General purpose PCB test and diagnostics.
- Locating shorts across VCC – GND, between PCB tracks, Shorted or partially shorted devices on a bus.
- Testing of customized devices and discrete components using QSM VI.
- Schematic generation using Circuit Trace for un documented PCBs.
User Segments
- Electronic PCB repair shops.
- Educational Institutes in teaching Test Engineering Subject.
- R & D Labs.
- Electronic Manufacturing Service (EMS) providers for board recovery.
QT-200 Mixed Signal Functional Test System is a proven model being used by thousands of users world over for varied Test & Reapplications. QT-200 can effectively test Digital, Analog and Mixed Signal Devices in Out of Circuit and In-Circuit in as wired condition and gives clear PASS-FAIL results. It covers all logic families within +/-12v logic levels including ECL, EIA, 3.3V etc. Hybrids, ASICs and unknown devices can be checked using QSM signature method. Optional IDDE software makes new device test program generation easy with graphical user interface. Edge Functional Test with Guided probe back tracking is supported for up to 96 Test pins. QSM VI channels are available from 48 channels to 256 maximum.QT200 is a Desk-Top Entry Level In-Circuit Functional Tester for Test & Repair of populated PCBs. It is capable of testing any 5V Logic device functionally in as wired “in-circuit” condition using vast Qmax device library. No matter, what in-circuit configuration of the device under test is, Qmax’s innovative auto compensation technique modifies the test vector to suit the device configuration on the fly. QT200 uses the back-driving or node-forcing technique to functionally test devices in-circuit. The in-built Auto Guarding Guide helps user to isolate those bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.
QT200 also offers QSM VI (Qmax Signature Method - VI) technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI helps to detect ESD induced failures and also enhances fault coverage using Moving Reference technique.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and is stored for future reference. A faulty board of identical type can be compared with the learnt board under Board Test.
QT200 provides the facility to create a visual board layout on the screen.
QT200 has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms, 2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
QT200 offers Resistance, Capacitance, Voltage (RCV) Measurement facility alongwith two channel oscilloscope.
QT200 can be interfaced to any PC with Windows-XP (or higher version) Operating System using USB 2.0.
- Functional Test Library (Digital / Analog / Mixed Signal) of >33K devices modelled using IEEE standard VHDL Language and PythonTD.
- Optional Russian Library & Military Part code Library.
- Power on True Digital and Analog Functional Test for both In-Circuit and Out of Circuit Tests.
- Test logic families: TTL / CMOS / ECL / EIA / 3.3V and more.
- Unknown or house coded device identification including LSI devices.
- Automatic internal pull-up/down for open collector and ECL devices.
- Functional testing without need for learning from known good board or circuit diagram using Digital Simulators and evaluation engine.
- On-Line Simulation makes accurate testing of sequential devices possible even when their Reset pins are disabled in In-Circuit conditions.
- Loop test to isolate intermittently failing devices.
- QSM VI Signature method for testing ASICs / Hybrids & Discretes.
- Board Learn / Compare mode increases board recovery rate.
- Versatile Device Pin Status Display with voltage / dynamic impedance / label display.
- Device Data sheet Display on demand for the device under test.
- Design Rule Checker for detection of illegal links, opens / shorts on device in both In-Circuit Functional Test and in QSM VI test for known devices.
- Automatic Guarding Guide for Bus Based Devices and O/C O/E devices.
- EPROM Data Learn and Compare Function.
- DEF 0053/1 compliance for the safe operating limits on back driving.
- Built-in Resistance, Capacitance and Voltage measurement capability.
- Powerful logic waveform display window for failure confirmation.
- Circuit Tracer for schematic generation / reverse engineering applications (Optional).
- IDDE software for easy Device Test Program Generation (Optional) with Fault coverage report.
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Russian Libray / Military Part Code Library.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Russian Libray / Military Part Code Library.
Basic 48 Digital Channels expandable up to 96. Basic 48 Anlaog Channels expandable up to 96 / 128 / 256
- In house maintanance of Electronic controls, PLCs, CNC in industrial automation.
- In House Maintanance of Bio- Medical Equipment such as MRI, CT scanners.
- In House Maintanance of Defense Electronics such as Radar systems, Military commuication systems etc.
- Third Party Maintanace Houses.
- R & D Labs.
- Hard Disk manufacturers for testing their Magnetic Head Pre-amp Flex circuits.
- Electronic Manufacturing Service (EMS) providers for board recovery.
- Go / No Go Functional Test using edge connectors / bed of nails / clips and probes.
- Small to medium volume production test of devices / Hybrids and PCBs.
- Very general purpose PCB test abd diagnostic system with extended features that include all logic families (including ECL), Analog and Mixed signal devices useful for In-House Maintanance and Third party repair of PCBs.
- Board Recovery in high volume production units.
- Hard Disk Magnetic Pre-amp Flex cable assaembly tester.
- Custom Test applications such as relay test / hybrid test and device tests.
- In-Coming Quality control applications for devices and assemblies.
In-Circuit Functional Testers - QT-8200
QT8200 comes with large device library written in QDDL / VHDL and PythonTD languages for In-Circuit and out of Circuit Testing of devices. While testing devices in-circuit, QT8200 employs the auto-compensation technique. When any of the inputs are linked together or connected to the power pins, the drive pattern or Test Vector is modified on the fly depending upon the In-Circuit links of the device under test.
The Qmax simulator simulates the output response on the new modified test vector. This is essential to avoid any clash between the pin drivers driving these pins with different logic levels at the same time.
QT8200 can test any Digital device in in-circuit for its functionality using library defined test patterns. The ICFT mode allows interactive testing of the individual devices, as well as whole board, comprising various devices. Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
QT8200 offers powerful Automatic Guarding Guide, while testing a BUS device such as Tri-state / bidirectional/ O.C. / O.E. device, it is required to guard the device under test by disabling other BUS devices present in the BUT which are on the same BUS.
QT8200 has auto guarding facility which lists the IC and the pins of those devices which may need to be guarded.
Trace Links Wizard makes auto guard list correction much simpler. QT8200 can perform an in-circuit clip-on test for analog devices. Using its three built-in true analog channels, QT8200drives true analog patterns to the input pins and senses the analog voltage at the output pinto give a clear Pass/Fail message. User needs to only clip-on & type in the part number of the device to be tested.
QT8200 has a powerful evaluation engine to test linear devices in-circuit, without the need to learn from a known good board.
QT8200 also offers QSM VI technique to test custom devices passive components on a board which cannot be functionally tested in the ICFT mode. QSM VI takes traces by driving a user defined current limited sine wave between any two nodes of the DUT and plotting the voltage Vs current trace.
Auto “Best Fit Curve” for QSM VI automatic selection of best source impedance, voltage and frequency of the VI stimulus.
RLCV measurements.
Frequency measurement up to 130 MHz.
3 channel Digital Oscilloscope and Function Generator.
Powerful “Board under Test” Power Supplies for testing large ECL boards often requiring 20A and more current.
Some of the Key Features
- In-Circuit Functional testing of digital, analog and mixed Signal Mixed Logic devices of various logic families within +/-12V.
- User programmable Actual test speed on the pin of DUT and it is up to 8 MHz (125 nano seconds).
- High current rating and five voltage output options for the BUT with latest SMPS module (450 watts).
- Qmax Fault Simulation Validated Vast Device Library of 33,200+ western ICs with optional Russian library of 1500+ ICs.
- Windows-based Visual Work Station OR TestDirector 6 software Auto guarding guide using trace links wizard.
- QSM VI - a unique analytical tool to troubleshoot faults on Hybrids / Custom ICs as well as ESD damaged devices.
- Powerful IDDE software to further expand the device library Optional : Fault Simulation Module.
- RLCV measurements.
- Frequency measurement up to 130 MHz.
- 3 channel Digital Oscilloscope and Function Generator.
- Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
- In built Simulator for In-Circuit compensation.
- Dual trace facility for probes and clips.
- Auto Guarding Guide for Bus based devices and OC / OE Devices.
- Logic analyzer waveform display for failure confirmation.
- Identify Unkown and House Coded devices including LSI devices.
- Graphical test program generator for Digital, Analog, Mixed signal devices.
- Mixed logic testing through dual palettes.
- Built in self-diagnostic facility for maintenance.
- Auto / Manual channel mapping facility for board functional test through card edge/fixtures.
- Modular system design for future up-gradation.
- Powerful Sequencer based hardware architecture
- Automatic internal pull-up/down for open collector and open emitter devices.
- Board Learn/Compare mode results in increased board recovery rate.
- Circuit Tracer for schematic generation / reverse engg. applications (Optional).
- IDDE software for easy Device Test Program Generation (Optional) with Fault coverage report.
- Military part code library.
CircuitTracer (Optional)This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray / Military Part Code Library.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray / Military Part Code Library.
Basic 48 Digital Channels expandable up to 96. Basic 48 Anlaog Channels expandable up to 96 / 128 / 256.
- In-house maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC, PLC, electronic PCBs troubleshooting.
- Hi-tech atomic / space labs and R & D labs for maintenance of sophisticated instrumentation / equipment.
- Hospitals for in-house maintenance of Biomedical equipment Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies Central Maintenance Centre of Universities, technical educational institutions, Engineering Colleges and Polytechnics.
- Private / Public Sector Units executing Defence Projects.
- Ruggedized version of QT8200 is QT8200M for military applications with camouflage paints.
- Go / No Go Functional Test using edge connectors / bed of nails / clips and probes.
- Small to medium volume production test of devices / Hybrids and PCBs.
- Very general purpose PCB test and diagnostic system with extended features that include all logic families (including ECL), Analog and Mixed signal devices useful for In-House Maintenance and Third party repair of PCBs.
- Custom Test applications such as relay test / hybrid test and device tests.
- PCB Diagnostics and Repair using In-Circuit Functional Test of High speed Devices, Microprocessors and Controllers.
- Inward Goods Inspection (IGI) for Digital / Analog / Mixed Signal ICs Complete Repair Station for Third party Maintenance.
- Production test of Flex Cable Assemblies for Hard Disk / Displays / Cameras.
QT8200M
Mixed Signal In-Circuit Functional Testers - QT-8200M
When any of the inputs are linked together or connected to the power pins, the drive pattern or Test Vector is modified on the fly depending upon the In-Circuit links of the device under test.
The Qmax simulator simulates the output response on the new modified test vector. This is essential to avoid any clash between the pin drivers driving these pins with different logic levels at the same time.
QT8200M can test any Digital device in in-circuit for its functionality using library defined test patterns. The ICFT mode allows interactive testing of the individual devices, as well as whole board, comprising various devices. Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
QT8200M offers powerful Automatic Guarding Guide, while testing a BUS device such as Tri-state / bidirectional/ O.C. / O.E. device, it is required to guard the device under test by disabling other BUS devices present in the BUT which are on the same BUS.
QT8200M has auto guarding facility which lists the IC and the pins of those devices which may need to be guarded.
Trace Links Wizard makes auto guard list correction much simpler. QT8200M can perform an in-circuit clip-on test for analog devices. Using its three built-in true analog channels, QT8200Mdrives true analog patterns to the input pins and senses the analog voltage at the output pinto give a clear Pass/Fail message. User needs to only clip-on & type in the part number of the device to be tested.
QT8200M has a powerful evaluation engine to test linear devices in-circuit, without the need to learn from a known good board.
QT8200M also offers QSM VI technique to test custom devices passive components on a board which cannot be functionally tested in the ICFT mode. QSM VI takes traces by driving a user defined current limited sine wave between any two nodes of the DUT and plotting the voltage Vs current trace.
Auto “Best Fit Curve” for QSM VI automatic selection of best source impedance, voltage and frequency of the VI stimulus.
RLCV measurements.
Frequency measurement up to 130 MHz.
3 channel Digital Oscilloscope and Function Generator.
Powerful “Board under Test” Power Supplies for testing large ECL boards often requiring 20A and more current.
Mixed Signal In-Circuit Functional Testers - QT-8200M
- In-Circuit Functional testing of digital, analog and mixed Signal Mixed Logic devices of various logic families within +/-12V.
- User programmable Actual test speed on the pin of DUT and it is up to 8 MHz (125 nano seconds).
- High current rating and five voltage output options for the BUT with latest SMPS module (450 watts).
- Qmax Fault Simulation Validated Vast Device Library of 33,200+ western ICs with optional Russian library of 1500+ ICs.
- Windows-based Visual Work Station OR TestDirector 6 software Auto guarding guide using trace links wizard.
- QSM VI - a unique analytical tool to troubleshoot faults on Hybrids / Custom ICs as well as ESD damaged devices.
- Powerful IDDE software to further expand the device library Optional : Fault Simulation Module.
- RLCV measurements.
- Frequency measurement up to 130 MHz.
- 3 channel Digital Oscilloscope and Function Generator.
- Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
- In built Simulator for In-Circuit compensation.
- Dual trace facility for probes and clips.
- Auto Guarding Guide for Bus based devices and OC / OE Devices.
- Logic analyzer waveform display for failure confirmation.
- Identify Unkown and House Coded devices including LSI devices.
- Graphical test program generator for Digital, Analog, Mixed signal devices.
- Mixed logic testing through dual palettes.
- Built in self-diagnostic facility for maintenance.
- Auto / Manual channel mapping facility for board functional test through card edge/fixtures.
- Modular system design for future up-gradation.
- Powerful Sequencer based hardware architecture
- Automatic internal pull-up/down for open collector and open emitter devices.
- Board Learn/Compare mode results in increased board recovery rate.
- Circuit Tracer for schematic generation / reverse engg. applications (Optional).
- IDDE software for easy Device Test Program Generation (Optional) with Fault coverage report.
- Military part code library.
Mixed Signal In-Circuit Functional Testers - QT-8200M
Repair Trouble-shooting Applications :
- Go / No Go Functional Test using edge connectors / bed of nails / clips and probes.
- Small to medium volume production test of devices / Hybrids and PCBs.
- Very general purpose PCB test and diagnostic system with extended features that include all logic families (including ECL), Analog and Mixed signal devices useful for In-House Maintenance and Third party repair of PCBs.
- Custom Test applications such as relay test / hybrid test and device tests.
- PCB Diagnostics and Repair using In-Circuit Functional Test of High speed Devices, Microprocessors and Controllers.
- Inward Goods Inspection (IGI) for Digital / Analog / Mixed Signal ICs Complete Repair Station for Third party Maintenance.
- Production test of Flex Cable Assemblies for Hard Disk / Displays / Cameras.
Mixed Signal In-Circuit Functional Testers - QT-8200M
- Exclusively designed cabinet for Defence application.
- High performance, Reliable tester with programmable test speed & test voltages.
- Vast Functional Test Library with 21,200+ devices including Digital & Analog ICs.
- Library Support for Western & Russian (1,500+) technology IC Chips.
- Clip-on Analog In-Circuit Functional IC test including Mixed Signal Devices, ICs.
- In-Circuit Functional Test for Digital, Analog & Mixed Logic Devies ESD test.
- TTL,CMOS.
- ECL, EIA, LSI, 3V3.
- Linear, 12V, Comparator, Regulator.
- PECL, Tiny Logic, liL.
- LSIs including processors, controllers and peripheral ICs.
- ADC & DAC.
- In built Simulator for In-Circuit compensation.
- Datalogger facility for device under test.
- Dual trace facility for probes and clips.
- 3 channel Digital scope facility.
- Logic analyzer waveform display for failure confirmation.
- Built in Signal generator.
- Device data dictionary.
- IC Identifier.
- Cluster Testing.
- Graphical test program generator for Digital, Analog, Mixed signal devices.
- Mixed logic testing through dual palettes.
- Open/Short Test.
- Board test Programming facility with conditional jumps on pass/fail.
- In-Circuit parameter prompt for device failure confirmation.
- In built R, C, V & F measurement capability.
- Auto / Manual channel mapping facility for board functional test through card edge/fixtures.
- Built in self-diagnostic facility for maintenance.
- Modular system design for future upgradation.
- Powerful Sequencer based hardware architecture<
- Automatic internal pull-up/down for open collector and open emitter devices.
- Board Learn / Compare mode results in increased board recovery rate.
- Circuit tracing facility between any family/components through clips & probes.
- Circuit Tracer software to create net lists for schematic generation / reverse engineering.
- IDDE software for easy test program generation.
Mixed Signal In-Circuit Functional Testers - QT-8200M
- In-house maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC, PLC, electronic PCBs troubleshooting.
- Hi-tech atomic / space labs and R & D labs for maintenance of sophisticated instrumentation / equipment.
- Hospitals for in-house maintenance of Biomedical equipment Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies Central Maintenance Centre of Universities, technical educational institutions, Engineering Colleges and Polytechnics.
- Private / Public Sector Units executing Defence Projects.
- Ruggedized version of QT8200 is QT8200M for military applications with camouflage paints.
PCB Diagnostic Systems - V200 Desk - Top ATE
V200 is designed as a Combinational Board Tester with Digital / Analog and Mixed Signal Test capabilities through simple clips and probes or through card edge or as a cluster tester with a special test fixture for up to 96 (Digital) 256 (Analog) test pins. In addition, it has the fully integrated Boundary Scan Test option for virtual pin test concept, where the number of virtual test pins has no physical limit. It’s has user programmable test speed and can generate test patterns at 10MHz data rate.V200 can perform In-Circuit Functional Test, testing individual lCs in In-Circuit or Out-of-Circuit with Pin Status Check & has In-built DRC (Design Rule Checker). V200 Utilizes IEEE Standard VHDL language based device library for digital devices. For Analog / Mixed Signal Devices, Python TD Test languages based scripts are available for stimulus and output evaluation.
Auto compensation and Identify unknown or house coded devices are extended for all digital devices (not limiting to SSI/MSI) and thus LSI / VLSI chips can be tested / identified in its In-Circuit configuration without the need to learn / remove from a known good board.
V200’s QSMVI Stimulus for VI Trace can be used from available Standard or from user defined wave pattern, thus not limiting the VI trace to simple sine wave alone. User defined wave pattern can be any mathematical wave Shape such as sine / triangle / square / ramp or even arbitrary patterns as desired by user and can be stored in the Library for possible re-use. The frequency is fully programmable from as fast as 100 KHz as a result of V200's vast time base selection capability.
"Best Fit Curve" - a unique feature, where the best drive pattern is automatically suggested to the user for the characteristics of the UUT to increase the fault coverage with advanced algorithm suggests the failing pin within A device with% probability.
V200 can perform Resistance, Inductance, Capacitance, Voltage and Frequency Measurement along with 3 Channel - 10Mega Sample Scope with Programmable Load and 3 Channel Function Generator.
V200 with TD6 Test Sequencer software allows Sequencing of multiple test using combination of isolated device test (ICFT), QSMVI, Measurements, Card Edge Functional Test, Integrated Card Edge +Boundary Scantest ', all in one test program.
Test Sequencer Software allows graphical TPS development using JPEG image of the PCB under test, tagging devices and pins. Adding tests to the devices, cluster is with just a right click of the mouse. Learn, verify and test options using mouse click on the device location.
Using V200 Card Edge Functional Test for complex boards with ASICs and BGAs, where no functional data are available, user can generate the test vectors using the graphical waveform editor or Python TD test vector generator, where the primary IO pins can be either physical edge pin or In Circuit pin or a JTAG Virtual Boundary Scan Pin. User can either learn the expected output from a known good board or define the expected output using graphical waveform editor or simulate the expected output using VHDL Simulation or the Python TD test language with mask or tolerance editing facilities. Test program developed can be used for a device or cluster or a complete PCB.
- V200 is designed as a Combinational Tester with Digital / Analog and Mixed Signal Test capabilities through simple Clips and probes or through card edge or as a cluster tester with a special test fixture for up to 96 digital test pins and up to 256 analog test pins and un-limited virtual test pins using Boundary Scan Test.
- Its basic timing unit is 100ns and thus can generate test patterns at 10 MHz data rate.
- The timing units are programmable in 2000 steps from 100ns to 200µs, (100ns, 200ns, 300ns etc up to 200µs) thus allowing accurate pattern timings.
- It has 8K X 4 RAM behind each digital pin electronics and 8K X 24 RAM behind every analog channel.
- Its advanced sequencer allows external event synchronization or handshake, which are very essential in complex microprocessor tests. Functional Test facility for testing individual ICs in In-Circuit or Out of Circuit.
- Pin Status Check & In-built DRC (Design Rule Checker).
- IEEE standard VHDL language in behavioural description of the function of the chip in its library.
- PythonTD Test language for Analog / Mixed signal device stimulus and output evaluation.
- Auto compensation is extended for all digital devices ( not limiting to SSI / MSI ) and thus LSI / VLSI chips can be tested in its in-circuit configuration without the need to learn from a known good board.
- High current rating and five voltage output options for the Board Under Test with latest SMPS module (450 watts).
- Qmax Fault Simulation validated vast Device Library of > 33,000 devices.
- Clock Terminator feature avoids false failures while testing state machine devices such as flip-flops and counters thus increasing productivity.
- Auto In-Circuit compensation.
- Auto Guarding Guide for Bus based devices and OC / OE Devices.
- Logic analyzer waveform display for failure confirmation.
- Identify Unkown and House Coded devices including LSI devices with advanced foot print match algorithm.
- Graphical test program generator for Digital, Analog, Mixed signal devices. Mixed logic testing through dual palettes.
- Automatic internal pull-up/down for open collector and open emitter devices.
- Automatic Guided Probe Back Tracking for Fault Isolation up to node level. User defined Error Log reporting. Failure analysis, statistics and datalog. Fault Simulation for card Edge Test
- Program and Library Device Programs.
- Fault Dictionary Data Base.
- QSM VI – a unique analytical tool to troubleshoot faults on Hybrids/Custom ICs as well as ESD damaged devices.
- “Best Fit Curve” algorithm in automatic selection of source impedance, frequency and amplitude of the VI stimulus signal for maximum fault coverage.
- Dual trace facility for probes and clips.
- User defined wave pattern as stimulus for VI Trace and thus not limiting the VI trace to simple sine wave alone.
- User Defined Wave pattern can be any mathematical wave shape such as sine / triangle / square / step / ramp or even arbitrary patterns as desired by user and can be stored in the Library for possible re-use.
- The frequency is fully programmable from as fast as 100 KHz (100 samples per cycle) down to 1 Hz due to V200's vast time base selection capability.
- User programmable amplitude, source impedance and frequency.
- Use of Step wave is useful in analyzing transient response of node.
- Incorporates Interactive mode as well as learn and compare.
- Fixed Reference, any pin to any pin or user combination.
- Frequency measurement up to 50 MHz.
- 3 channel Digital Oscilloscope with programmable load and Function Generator .
- Board Learn/Compare mode results in increased board recovery rate.
- Interactive, TestSequencer and TestStation Software package – TD6.
- Optional Circuit Tracer for schematic generation / reverse engineering applications.
- Optional IDDE software for easy Device Test Program Generation with Fault coverage report.
- Optional Russian Device Library & Military part code library.
- Resistance / Capacitance / Inductance Measurements.
- Diode Measurements.
- Frequency Measurements.
- Period / Time Measurements.
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray
Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray
Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
Basic 48 Digital Channels expandable up to 96. Basic 48 Anlaog Channels expandable up to 96 / 128 / 256.
- In-House maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC,PLC, electronic PCBs troubleshooting.
- Hi-tech atomic/space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Hospitals for in house maintenance of Biomedical equipment.
- Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies.
- Central Maintenance Centre of Universities, technical educational institutions ,Engineering Colleges and Polytechnics.
- Complete Repair Station for Third Part Maintenance.
- Whole board Testing through Card Edge for Plug in type modules.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices.
- Production Testing of PCB assemblies / Electronics Modules.
- Testing of Board populated with High Pin count Boundary Scan Compatible Devices.
QT-PXI-35
The Qmax's In-Circuit Measurement Module in PXI platform can be used to measure values of Resistsance, Capacitance and Inductance using 4 / 6 wire measurement technique. Auto Balancing bridge method is used for more accurate and wide measurement ranges. The Active guard (2 wire) can isolate the component under test from the parallel impedance with a good Guard Ratio. When used along with a bed of nail fixture and channel multiplexer or analoh highways, it can be used as a manufacturing defect analyzer (MDA) for checking the values of resistors, capacitors and inductors In-Circuit with active guard.
- Resitance range uo to 1M Ohms,
- Capaitance from 10pF to 1000uF,
- Inductance from 1uH to 30H.
- 2 / 4 / 6 wire measurement options.
- Guard ration of 10 with 1% tolerance and Guard ration of 100 with 10% tolerance.
- 4 high power guard channels of 1.2 A each capacity.
- Stimulus voltage of 100mV P/P to eliminate turning on of semicon diodes and transistors in-Circuit.
- Single 3U cPCI / PXI Based Platform.
- Can be easily integtared on a PXI based test platform.
- Software driver support for Windows 7.
- PCB Repair shops.
- Electronic Manufacturing Service (EMS) companies.
- R&D Labs.
- Lab Isntrument in Educational Institutions in teaching LCR measurement comcepts,
- In-Circuit Guarding, Guard Ratio etc.
- Automated Populated PCB Test in a production line.
- Diagnosing faults in analog circuits.
- As a In-Circuit LCR Meter.
V250 is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 10 MHz 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice. The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface or PCMCIA PCI express.
It is a modular design with upgrade options. The basic system comes with 64 Universal Channels, software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 2 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 256 or more Digital Channels, 4 Analog Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, and Integrated Boundary Scan Test.
- Maximum Digital test speed on the pin of DUT is up to 25 MHz and 10MHz Analog Testing ( 25MHz Sampling Rate).
- VHDL & Python TD Based Device Library for 31000+ Models.
- Four 14 Bit RAM based Analog Channels switchable across all 256 Channels with wider range of source impedance selection.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- Automatic Guided Probe Back Tracking for Fault Isolation up to node level.
- User defined Error Log reporting. Failure analysis, statistics and datalog.
- Fault Simulation for card Edge Test Program and Library Device Programs and optional Fault Dictionary.
- 256k X 6 RAM behind every Digital pin and 256K X 28 behind every analog pin.
- Programmable Time base from 40ns to 167ms in steps of 10ns
- User defined analog stimulus QSM VI with Auto Best Fit Curve Algorithm.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- Digital Highway for measurement of Frequency.
- 4 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 160 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and auto analog calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- Euro Connector Test Interface with optional VPC Mass Interconnect adapter with 16 bit fixture ID with Power / RF connectors and Test Signal pins.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
CircuitTracer (Optional) This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library: Russian Libray / Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library: Russian Libray / Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
Basic 64 Digital Channels and expandable up to 256 in steps of 32 channels. Anlog highway options. PXI / GPIB / LXI / USB Intrumentation options. Programmable power supply options. VPC Mass interconnect option.
- In-House maintenance wings of PSUs
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC,PLC, electronic PCBs troubleshooting.
- Hi-tech atomic/space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Hospitals for in house maintenance of Biomedical equipment.
- Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies.
- Central Maintenance Centre of Universities, technical educational institutions ,Engineering Colleges and Polytechnics.
- Complete Repair Station for Third Part Maintenance
- Whole board Testing through Card Edge for Plug in type modules
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices.
- Production Testing of PCB assemblies / Electronics Modules.
- PCB Diagnostic & Repair using In-Circuit Functional testing of High Speed Devices / Microprocessors and Controllers.
- Testing of Board populated with High Pin count Boundary Scan Compatible Devices.
Qmax V2200 Desk Top ATE system is the best solution for ATE Labs. ATE V2200 system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs. It can perform as In–Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed.It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices. Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers. To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.
Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements. Both DC and AC parameters are read from the Device Library and hence loose devices can be tested for both functionality as well as DC and AC parameters as specified in their data sheet. This feature is extreamy useful in Stringent In-coming QC applications.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice. Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides up to 384 signal pins, 19 power (50A each) and 19 RF connectors. The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express.
It is a modular design with upgrade options. The basic system comes with 128 Universal Channels programmable for High Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 160 or more Digital Channels with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
- Maximum Digital test speed on the pin of DUT is up to 25 MHz and 10MHz Analog Testing ( 25MHz Sampling Rate).
- VHDL & Python TD Based Device Library for 31000+ Models.
- Four 14 Bit RAM based Analog Channels switchable across all 256 Channels with wider range of source impedance selection.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- Automatic Guided Probe Back Tracking for Fault Isolation up to node level.
- User defined Error Log reporting. Failure analysis, statistics and datalog.
- Fault Simulation for card Edge Test Program and Library Device Programs and optional Fault Dictionary.
- 256k X 6 RAM behind every Digital pin and 256K X 28 behind every analog pin.
- Programmable Time base from 40ns to 167ms in steps of 10ns Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways and AC parametric measurements for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 8 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 160 test pins.
- User defined analog stimulus QSM VI with Auto Best Fit Curve Algorithm.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and auto analog calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- Integrated VHDL Simulator as per IEEE standards
- Paperless Repair Station.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Test Program Migration form Different other Platform to Qmax System.
- VPC Mass Interconnect adapter with 16 bit fixture ID with Power / RF connectors and Test Signal pins.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Test-Jig adopters for system self-test and calibration.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
- In-House maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC,PLC, electronic PCBs troubleshooting.
- Hi-tech atomic/space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Hospitals for in house maintenance of Biomedical equipment.
- Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies.
- Central Maintenance Centre of Universities, technical educational institutions ,Engineering Colleges and Polytechnics.
- Complete Repair Station for Third Part Maintenance.
- Whole board Testing through Card Edge for Plug in type modules.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices.
- Production Testing of PCB assemblies / Electronics Modules.
- PCB Diagnostic & Repair using In-Circuit Functional testing of High Speed Devices / Microprocessors and Controllers.
- Testing of Board populated with High Pin count Boundary Scan Compatible Devices.
QT2256-320 PXI
Automated Test Equipment (ATE) : QT2256 - 320 PXI - Combination Board Testers
QT2256 - 320 PXI - is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice.
Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides for signal pins, Power (50A each) pins and RF connectors.The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express. It is a modular design with upgrade options. The basic system comes with 128 Universal Pin Drivers, Software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 320 Digital Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
Features :
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Four Analog channels with 12 bit DAC and ADC and 40MHz sampling rate multiplex able to all test channels.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- AC Parametric Tests. - Measurements of Frequency, Pulse Width, Propagation delay, Rise / Fall times.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 12 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 320 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- VPC Mass Interconnect adapter with 16 bit fixture ID, Signal pins, Power and RF Connectors.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
- Complete Repair Station for Third Part Maintenance as a Combinational Board tester.
- Full Board Functional Testing through Card Edge for LRUs (Line Replaceable units).
- As a Bed of Nail In-Circuit Tester in production lines.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices for stringent Quality Control that includes function, DC and AC Parameters.
- Testing of Board populated with a mixture of High Pin count Boundary Scan Compatible Devices and non boundary scan devices.
- In-House maintenance wings of Defense Establishments.
- Electronic manufacturing units for Board recovery and Production line testing.
- Transporation sector such as MRTs, Railways, Aircraft, Ships etc.
- Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
QT2256-640 PXI
Automated Test Equipment (ATE) : QT2256 - 640 PXI - Combination Board Testers
QT2256 - 320 PXI - is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice.
Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides for signal pins, Power (50A each) pins and RF connectors.The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express. It is a modular design with upgrade options. The basic system comes with 128 Universal Pin Drivers, Software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 320 Digital Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Four Analog channels with 12 bit DAC and ADC and 40MHz sampling rate multiplex able to all test channels.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- AC Parametric Tests. - Measurements of Frequency, Pulse Width, Propagation delay, Rise / Fall times.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 12 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 320 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- VPC Mass Interconnect adapter with 16 bit fixture ID, Signal pins, Power and RF Connectors.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
- Complete Repair Station for Third Part Maintenance as a Combinational Board tester.
- Full Board Functional Testing through Card Edge for LRUs (Line Replaceable units).
- As a Bed of Nail In-Circuit Tester in production lines.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices for stringent Quality Control that includes function, DC and AC Parameters.
- Testing of Board populated with a mixture of High Pin count Boundary Scan Compatible Devices and non boundary scan devices.
- In-House maintenance wings of Defense Establishments.
- Electronic manufacturing units for Board recovery and Production line testing.
- Transporation sector such as MRTs, Railways, Aircraft, Ships etc.
- Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
Boundary Scan Testers - QScan
Qscan is a bench top Test Equipment with USB connectivity to a host PC / Laptop. It is a IEEE 1149 standard Boundary Scan contoller with Dgital and Analog I/O channels. It can be used to test PCBs populated with JTAG compatible devices through a 5 wire JTAG interface and edge connector channelled to the digital and analog I/O pins of the system. It can perform chain detection, Automatic Interconnection test between JTAG devices using virtual test pin concept and also to the edge connectors using the physical test pins of the system. It can also perform edge connector functional test of the entire PCB through powerful software. User can program the test vector using a graphical test pattern editor for both edge pins and JTAG pins thus testing the entire board including non JATG devices in between them. Anlog I/O option cards can be sued to inject analog signals as well as read analog waveforms in synchrnization with the digital patters. Qscan can also be used to digital devices out of circuit using its vast library and ZIF socket adopter.
- IEEE Standard JTAG Test system.
- 32 channel bi-directional I/O pins with programmable drive levels.
- Up to 320 digital I/O Channels.
- Up to 4 Drive / Sense Analog channels.
- Scan Chain Detection.
- User code / Device code verification.
- Interconnect test.
- Board Functional Test.
- Test of Non Boundary Scan Devices using JTAG pins of BS devices and edge connector.
- Test of Mixed Signal and Analog portion of the board using Digital and Analog channels.
- Board Under Test power supply under sofware control.
Out of Circuit Functional Test of Digital Devices - Library. TD6 options.
32 Channel Digital I/O card up to 10 Maximum. 2 Channel Analog card, 2 maximim. Out of Circuit Test Adopters (ZIF Sockets) for testing loose devices.
- Electronic Test and Repair shops.
- Electronic Manufacturing service (EMS) companies.
- R & D Labs.
Functional Test of Latest PCBs with High desity / high pincount devices without having to know what is inside these chips.
QT-PXI-95
QT-95 PXI Is a PXI based Boundary Scan Test controller and I/O channle soffering test solution for latest generation PCBs with high pin count - high density packages such a BGA and others. It uses the IEEE Standard JTAG virtual test pin concept in test access thereby eliminating the need for physical test pins, which is impossible in these latest generation PCBs. The Virtual Test Pin Concept along with edge connector test access eliminates very expensive or impossible bed of nail test fixture and limited channel flying probes. It is designed to provide a test solution for both a board with all Boundary Scan compatible devices or a board with a mixture of Boundary Scan Cmpatible devices and Non Boundary Scan devices. Other than the 4/5 wire JTAG intercae, the system provides Digital and optional Analog I/O Channels as physical test pins that be connected to the edge connector or thrugh a simple low cost test clips / fixtures.
- IEEE stanadrad compliance to 1149.1, 1149.6 and 1532. BS Controlled synchronous Digital I/O channels with FIFO memeory for fast speeed of test. Basic System controller with 64 channel digital I/O. Expandable Digital I/O Channels of 128 channel cards. Individually configurable Bi-Directional I/O channels. Programmable voltage levels for Digital I/O supporting 1.5V, 1.8V, 2.5V and 3.3V and user programmable. Fits in any 3U standrad PXI chassis. Software support in Winows Vista / Windows 7.
- PCB Repair shops
- Electronic Manufacturing Service (EMS) companies.
- R&D Labs
- Lab Isntrument in Educational Institutions in teaching Boundary Scan Concepts.
- Automated Board test that has BS devices.
- Diagnosing faults down to componnet level using Boundaru Scan Virtual Test pin concept and a guided probe back tracking.
- Functional test of Flash / RAM / EPROM using virtual test pins.
- Functional test of Non BS devices using virtual test pins f JTAG devices and other physical test pins / edge connectors.
QNIMITS
PCB Repairs - QNimits
Overview
Today's PCBs are so complex in nature and with more of proprietary devices. In most cases the schematics and internal functional details are un available for third party maintenance personnel. Thus diagnosing faults in such PCBs are difficult task using conventional test instruments such as multi-meter or oscilloscope that are normally found in repair shops. Today’s Semi-con devices are more reliable than it was a decade ago but still reliability is not 100%. When they fail, most likely the faults occur on the periphery of devices i.e. I/O pins as theyare more susceptible to damage by external forces such as lightning, short circuit, over load etc, these can be easily tracked by VI – Curve, the nodal impedance test.
QNImits is an innovative hand held test instrument which uses the industry’s proven V-I Trace technique of learn and compare of Nodal impedances. Using this technique the technician only requires a known good board for comparison with a faulty one without having the need of schematics and functional details of such PCBs. The known good board’s VI traces can be learnt and stored for future reference as well.
QNImits uses probe – reference (usually Ground) to either on-line (side by side) comparison of each node or alternatively uses external MUX switch and clips / adopters for multi-pin learn and compare.
QNimits, displays the test results as VI trace which shows the current against applied voltage in most commonly used graphical view. These trace formats help the user to easily understand the nodal behavior and interpret the results for quick diagnostics.
Some of our key features
- Unique Trouble-shooting Tool.
- Nodal Impedance Test.
- Save & Compare Facility.
- Data Transfer to PC through USB Port.
- In-built Color LCD TFT Screen.
- Truly Portable Battery operated Unit.
Trouble shoot Electronic PCBs with no data / schematics. Check nodal impedances of electric circuits. Check for fake components. Use in incoming QC for electronic components. BGA Solder check.
User Segments
- In-house or Third Party Service Centers.
- Recovery of Failed Boards in Manufacturing Process
- Electronic Manufacturing Service Companies.
- Electronic Design and Proto type test centers
PCB TroubleShooting - QT25 - Unique low cost short locator
QT-25 is used to detect exact short circuit locations across VCC - GND or a shorted component connected across a Bus. It can also detect hair-line shorts between PCB tracks. Ideally PCB tracks are supposed to have zero resistance, but in actual conditions they have small resistance. The exact location of the short is where the instrument reads the lowest value of resistance in micro - milli ohms range.QT-25/offers Offset Mode, where the residual resistance of a shorted Component or nodes can be offset digitally, so that the instrument can be used at the Higher sensitive range of 200 milli-ohms in order to locate the shors.
QT-25 is designed to apply a constant current with a stimulus voltage of less than 200 millivolts so as to avoid turning onthe semiconductor devices in the circuit. The system comes with 2 sharp probes to poke through the insulation or solder mask in order to make a good contact.
QT-25 uses 4-wire measurement technique for accuracy.
QT-25 can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode.
Resistance dependant, modulated frequency audio tone output (whose pitch increases with decreasing resistance value) is also provided.
Some of the Key Features
- Standalone bench top instrument.
- 16 Character LCD Display and easy controls.
- 4 wire resistance measurement
- Complimenting modulated audio tone.
- Resistance range of 200 milliohms, 2 ohms and 200 ohms.
- 100 micro ohm resolution in 200 milli ohm range.
- Offset offset capability upto 200 ohms.
Applications
Locate shorts across Power / GND planes, Locate shorted / partially shorted Decoupling Cap across VCC – GND, Locate hair-line shorts between tracks, Measure contact resistance of switches and relays., Measure milli-ohm resistance of cables / PCB tracks.
Locate shorts across Power / GND planes, Locate shorted / partially shorted Decoupling Cap across VCC – GND, Locate hair-line shorts between tracks, Measure contact resistance of switches and relays., Measure milli-ohm resistance of cables / PCB tracks.
User Segments
In-House or third party repair centers. R& D Labs, Electronic Manufactruing Service (EMS) Companies.
In-House or third party repair centers. R& D Labs, Electronic Manufactruing Service (EMS) Companies.
QT25PXI
PCB ICFT TESTERS - QT-PXI-25 - PXI based Micro - Ohm Meter
QT-25PXI is a PXI based Virtual Instrument that can be used to Measure contact resistance of Switches and Relays. It can also detect exact short circuit locations across VCC - GND or a shorted component connected across a Bus and hair-line shorts between PCB tracks.QT-25PXI offers Offset Mode, where the residual resistance of a shorted component or nodes can be offset digitally, so that the instrument can be used at the higher sensitive range of 200 milli-ohms in order to locate the short.
QT-25PXIis designed to apply a constant current with a stimulus voltage of less than 200 millivolts so as to avoid turning onthe semiconductor devices in the circuit. The system comes with 2 sharp probes to poke through the insulation or solder mask in order to make a good contact.
QT-25PXIuses 4-wire measurement technique for accuracy.
Resistance dependent, modulated frequency audio tone output (whose pitch increases with Decreasing resistance value) is also provided.
Some of the Key Features
- 3U cPCI / PXI Platform for rugged Environment
- Hot Swap (Live Insertion / removal)
- 4 wire resistance measurement
- Complimenting modulated audio tone.
- Resistance range of 200 milliohms, 2 ohms and 200 ohms.
- 100 micro ohm resolution in 200 milli ohm range.
- Offset offset capability upto 200 ohms.
Applications
- Build Relay Testers using QT25PXI and Relay drivers in a PXI platform.
- Locate shorted / partially shorted Decoupling Cap across VCC – GND
- Locate hair-line shorts between tracks
- Automated Cable / Harness test in PXI platform.
User Segments
- Relay / Switch manufacturing units.
- Cable Harness manufacturers.
- R&D Labs
- Electronic Manufacturing Service (EMS) providers.
