Panther II
| Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical. High speed testing at 2 seconds for 2 million test combinations. Can be interfaced to any type of test fixtures Multi-Site Test support for Strip or Multiple device test. 16 Opto Isolated digital outputs for handler interface, binning and PASS FAIL indicators. 16 Opto Isolated Digital Inputs for Operator console and handler interface. Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers. Fast turnaround time to test new products. |  |
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Whole Board PCB Testers - Panther II - Ultra fast open / short / Diode Drop tester
FeaturesPanther II is a new generation Open / Short tester applied for Semiconductor Industry with whole new fleet of features that makes the task reliable, complete and fast. It uses Force Current - Measure voltage to test opens, shorts, leaks and diode drops.
It uses the Learn from a Known Good Board and test against target device technique.This reduces the time required to generate, otherwise, tedious test program generation.
Typical test time for a 500 pin BGA device in both forward and reverse bias conditions with 5 band comparators, is estimated to be about 0.25 second test time. Its hardware compare makes instant PASS / FAIL resilts with very less software overhead time for display and data log.
Optional Hardware can be ordered and configure for:
- In-Circuit Measurement of RLC values using 4/6 wire Kelvin measurements.
- VI-Trace,
- A/c Stimulus for contact less open / short test.
- RAM based PMU for Force Voltage - Measure Current OR Force Current - Measure Voltage.
Standard Panther II:
- It uses an ultra fast programmable current source.
- The current is programmable from as low as few micro amps to 50 milli amps in three ranges and 13-bit resolution.
- The voltage compliance (Voltage Clamp) is also programmable within between -2V and +7V in 13-bit resolution
- The time base is programmable from 1µs per test to 256µs per test in steps of 1µs. The time base can be 1µs, 2µs, 3µs, 4µs etc upto 256µs. Programmable wait states per test pair pin is from zero to 255 wait states. A time base selection of 2µs and wait state selection of zero, gives 2µs test time. Wait state selection of 1 gives 4µs test time, wait state of 2 gives 6µs and this is programmable for each test combination individually
- This means each test combination can have its own wait states allowing longer settling time for some pin pairs where required and default zero wait states for other pin pairs to maximize the test time as whole
- Wherever possible, we select products made from environmentally sustainable timber or better still from rubberwood, which is a natural by-product of the rubber production process. We communicate and promote the environmental credentials of such products to our customers.
- Panther II has four comparators with their thresholds fully programmable in 13-bit resolution within 5v range and produces a 4-bit test result code for each test combination
Programmable Hardware Comparators:
- Panther II has four comparators with their thresholds fully programmable in 13-bit resolution within 5v range and produces a 4-bit test result code for each test combination.
- The user can choose to use one comparator for simple open / short application (2 band, 1 bit test result code), 2 comparators for open / diode (0.6v) / short classification (3 band, 2 bit test result code), 3 comparators for open / high impedance or 1.2v diode/ diode (0.6v) / short (four band, 3 bit test result code) or even four comparators for open / high impedance or 1.2v diode / diode (0.6v) / near short or diode (0.3v) / short (5 band, 4bit test result code) classifications.
- Five-band comparison gives maximum information in a single test and allows device grading and checks out devices at threshold and pin-to-pin leakages that a normal OS tester cannot detect or require multiple tests with different thresholds.
- Panther II utilizes full hardware comparison so as to achieve fastest time for test.
- It can accept open / short data entered by operator or a net-list import or can Learn from a known Golden Device.
- By utilizing hardware compare the Go - NoGo test time is just the hardware drive time and it is the fastest.
- For a full failure analysis (FA) it can give the complete failure information for up to 4 Mega test combinations from its acquisition RAM.It also has the facility to store the first 8192 failures for an optimum Test and FA information retrieval Time.
- Panther II uses 4-wire measurement using fast analog switches for accurate voltage measurements and improves accuracy.
- Each Mux card holds 256 channels with 4-wire measurement capability.
- Maximum of 8 MUX cards allowing 2048 channel system.
Multiple Test Techniques:
Mode 1 : Serial Shift Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device. For a 208 pin device, no. of tests are 208.Mode 2 : Fixed Reference Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device. For a 208 pin device, no. of tests are 208.Mode 3 : Half QSM Method - n*(n-1)/2 combinations
In this mode, all combinations of pins are tested as pair by pair excluding reverse combinations. Same pin as reference pin and test pin combination is skipped. Example, Pin 1 as ref and pin 2 to n are test pins, then pin 2 as ref, pins 3 to n as test pins. The no. of test combinations for this method with 2048 channels are 2 Mega combinations.Mode 4 : Full QSM Method - n*(n-1) combinations
In this mode, all combinations of pins are tested as pair by pair including the reverse combinations. Example, Pin 1 as ref and pin 1 to n are test pins, then pin 2 as ref and pins 1 to n as test pins (Same pin as reference pin and test pin combination is skipped). Thus in this mode both normal and reverse polarity combinations are tested automatically. No. of test combinations for 2048 channels will be 4 Mega combinations.Mode 5 : Ram Based select sequences
In this mode, the required test pin / reference pin addresses have to be filled in the RAM and the tester does only those combinations. The designed capacity for RAM based sequences are 4 MEGA combinations.
QT-200 Mixed Signal Functional Test System is a proven model being used by thousands of users world over for varied Test & Reapplications. QT-200 can effectively test Digital, Analog and Mixed Signal Devices in Out of Circuit and In-Circuit in as wired condition and gives clear PASS-FAIL results. It covers all logic families within +/-12v logic levels including ECL, EIA, 3.3V etc. Hybrids, ASICs and unknown devices can be checked using QSM signature method. Optional IDDE software makes new device test program generation easy with graphical user interface. Edge Functional Test with Guided probe back tracking is supported for up to 96 Test pins. QSM VI channels are available from 48 channels to 256 maximum.QT200 is a Desk-Top Entry Level In-Circuit Functional Tester for Test & Repair of populated PCBs. It is capable of testing any 5V Logic device functionally in as wired “in-circuit” condition using vast Qmax device library. No matter, what in-circuit configuration of the device under test is, Qmax’s innovative auto compensation technique modifies the test vector to suit the device configuration on the fly. QT200 uses the back-driving or node-forcing technique to functionally test devices in-circuit. The in-built Auto Guarding Guide helps user to isolate those bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.
QT200 also offers QSM VI (Qmax Signature Method - VI) technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI helps to detect ESD induced failures and also enhances fault coverage using Moving Reference technique.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and is stored for future reference. A faulty board of identical type can be compared with the learnt board under Board Test.
QT200 provides the facility to create a visual board layout on the screen.
QT200 has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms, 2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
QT200 offers Resistance, Capacitance, Voltage (RCV) Measurement facility alongwith two channel oscilloscope.
QT200 can be interfaced to any PC with Windows-XP (or higher version) Operating System using USB 2.0.
- Functional Test Library (Digital / Analog / Mixed Signal) of >33K devices modelled using IEEE standard VHDL Language and PythonTD.
- Optional Russian Library & Military Part code Library.
- Power on True Digital and Analog Functional Test for both In-Circuit and Out of Circuit Tests.
- Test logic families: TTL / CMOS / ECL / EIA / 3.3V and more.
- Unknown or house coded device identification including LSI devices.
- Automatic internal pull-up/down for open collector and ECL devices.
- Functional testing without need for learning from known good board or circuit diagram using Digital Simulators and evaluation engine.
- On-Line Simulation makes accurate testing of sequential devices possible even when their Reset pins are disabled in In-Circuit conditions.
- Loop test to isolate intermittently failing devices.
- QSM VI Signature method for testing ASICs / Hybrids & Discretes.
- Board Learn / Compare mode increases board recovery rate.
- Versatile Device Pin Status Display with voltage / dynamic impedance / label display.
- Device Data sheet Display on demand for the device under test.
- Design Rule Checker for detection of illegal links, opens / shorts on device in both In-Circuit Functional Test and in QSM VI test for known devices.
- Automatic Guarding Guide for Bus Based Devices and O/C O/E devices.
- EPROM Data Learn and Compare Function.
- DEF 0053/1 compliance for the safe operating limits on back driving.
- Built-in Resistance, Capacitance and Voltage measurement capability.
- Powerful logic waveform display window for failure confirmation.
- Circuit Tracer for schematic generation / reverse engineering applications (Optional).
- IDDE software for easy Device Test Program Generation (Optional) with Fault coverage report.
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Russian Libray / Military Part Code Library.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Russian Libray / Military Part Code Library.
Basic 48 Digital Channels expandable up to 96. Basic 48 Anlaog Channels expandable up to 96 / 128 / 256
- In house maintanance of Electronic controls, PLCs, CNC in industrial automation.
- In House Maintanance of Bio- Medical Equipment such as MRI, CT scanners.
- In House Maintanance of Defense Electronics such as Radar systems, Military commuication systems etc.
- Third Party Maintanace Houses.
- R & D Labs.
- Hard Disk manufacturers for testing their Magnetic Head Pre-amp Flex circuits.
- Electronic Manufacturing Service (EMS) providers for board recovery.
- Go / No Go Functional Test using edge connectors / bed of nails / clips and probes.
- Small to medium volume production test of devices / Hybrids and PCBs.
- Very general purpose PCB test abd diagnostic system with extended features that include all logic families (including ECL), Analog and Mixed signal devices useful for In-House Maintanance and Third party repair of PCBs.
- Board Recovery in high volume production units.
- Hard Disk Magnetic Pre-amp Flex cable assaembly tester.
- Custom Test applications such as relay test / hybrid test and device tests.
- In-Coming Quality control applications for devices and assemblies.
QT-PXI-35
The Qmax's In-Circuit Measurement Module in PXI platform can be used to measure values of Resistsance, Capacitance and Inductance using 4 / 6 wire measurement technique. Auto Balancing bridge method is used for more accurate and wide measurement ranges. The Active guard (2 wire) can isolate the component under test from the parallel impedance with a good Guard Ratio. When used along with a bed of nail fixture and channel multiplexer or analoh highways, it can be used as a manufacturing defect analyzer (MDA) for checking the values of resistors, capacitors and inductors In-Circuit with active guard.
- Resitance range uo to 1M Ohms,
- Capaitance from 10pF to 1000uF,
- Inductance from 1uH to 30H.
- 2 / 4 / 6 wire measurement options.
- Guard ration of 10 with 1% tolerance and Guard ration of 100 with 10% tolerance.
- 4 high power guard channels of 1.2 A each capacity.
- Stimulus voltage of 100mV P/P to eliminate turning on of semicon diodes and transistors in-Circuit.
- Single 3U cPCI / PXI Based Platform.
- Can be easily integtared on a PXI based test platform.
- Software driver support for Windows 7.
- PCB Repair shops.
- Electronic Manufacturing Service (EMS) companies.
- R&D Labs.
- Lab Isntrument in Educational Institutions in teaching LCR measurement comcepts,
- In-Circuit Guarding, Guard Ratio etc.
- Automated Populated PCB Test in a production line.
- Diagnosing faults in analog circuits.
- As a In-Circuit LCR Meter.
V250 is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 10 MHz 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice. The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface or PCMCIA PCI express.
It is a modular design with upgrade options. The basic system comes with 64 Universal Channels, software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 2 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 256 or more Digital Channels, 4 Analog Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, and Integrated Boundary Scan Test.
- Maximum Digital test speed on the pin of DUT is up to 25 MHz and 10MHz Analog Testing ( 25MHz Sampling Rate).
- VHDL & Python TD Based Device Library for 31000+ Models.
- Four 14 Bit RAM based Analog Channels switchable across all 256 Channels with wider range of source impedance selection.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- Automatic Guided Probe Back Tracking for Fault Isolation up to node level.
- User defined Error Log reporting. Failure analysis, statistics and datalog.
- Fault Simulation for card Edge Test Program and Library Device Programs and optional Fault Dictionary.
- 256k X 6 RAM behind every Digital pin and 256K X 28 behind every analog pin.
- Programmable Time base from 40ns to 167ms in steps of 10ns
- User defined analog stimulus QSM VI with Auto Best Fit Curve Algorithm.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- Digital Highway for measurement of Frequency.
- 4 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 160 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and auto analog calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- Euro Connector Test Interface with optional VPC Mass Interconnect adapter with 16 bit fixture ID with Power / RF connectors and Test Signal pins.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
CircuitTracer (Optional) This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library: Russian Libray / Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library: Russian Libray / Military Part Code Library.
Boundary Scan Software: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software.
Basic 64 Digital Channels and expandable up to 256 in steps of 32 channels. Anlog highway options. PXI / GPIB / LXI / USB Intrumentation options. Programmable power supply options. VPC Mass interconnect option.
- In-House maintenance wings of PSUs
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC,PLC, electronic PCBs troubleshooting.
- Hi-tech atomic/space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Hospitals for in house maintenance of Biomedical equipment.
- Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies.
- Central Maintenance Centre of Universities, technical educational institutions ,Engineering Colleges and Polytechnics.
- Complete Repair Station for Third Part Maintenance
- Whole board Testing through Card Edge for Plug in type modules
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices.
- Production Testing of PCB assemblies / Electronics Modules.
- PCB Diagnostic & Repair using In-Circuit Functional testing of High Speed Devices / Microprocessors and Controllers.
- Testing of Board populated with High Pin count Boundary Scan Compatible Devices.
Qmax V2200 Desk Top ATE system is the best solution for ATE Labs. ATE V2200 system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs. It can perform as In–Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed.It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices. Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers. To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.
Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements. Both DC and AC parameters are read from the Device Library and hence loose devices can be tested for both functionality as well as DC and AC parameters as specified in their data sheet. This feature is extreamy useful in Stringent In-coming QC applications.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice. Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides up to 384 signal pins, 19 power (50A each) and 19 RF connectors. The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express.
It is a modular design with upgrade options. The basic system comes with 128 Universal Channels programmable for High Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 160 or more Digital Channels with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
- Maximum Digital test speed on the pin of DUT is up to 25 MHz and 10MHz Analog Testing ( 25MHz Sampling Rate).
- VHDL & Python TD Based Device Library for 31000+ Models.
- Four 14 Bit RAM based Analog Channels switchable across all 256 Channels with wider range of source impedance selection.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- Automatic Guided Probe Back Tracking for Fault Isolation up to node level.
- User defined Error Log reporting. Failure analysis, statistics and datalog.
- Fault Simulation for card Edge Test Program and Library Device Programs and optional Fault Dictionary.
- 256k X 6 RAM behind every Digital pin and 256K X 28 behind every analog pin.
- Programmable Time base from 40ns to 167ms in steps of 10ns Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways and AC parametric measurements for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 8 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 160 test pins.
- User defined analog stimulus QSM VI with Auto Best Fit Curve Algorithm.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and auto analog calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- Integrated VHDL Simulator as per IEEE standards
- Paperless Repair Station.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Test Program Migration form Different other Platform to Qmax System.
- VPC Mass Interconnect adapter with 16 bit fixture ID with Power / RF connectors and Test Signal pins.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Test-Jig adopters for system self-test and calibration.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
- In-House maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC,PLC, electronic PCBs troubleshooting.
- Hi-tech atomic/space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Hospitals for in house maintenance of Biomedical equipment.
- Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies.
- Central Maintenance Centre of Universities, technical educational institutions ,Engineering Colleges and Polytechnics.
- Complete Repair Station for Third Part Maintenance.
- Whole board Testing through Card Edge for Plug in type modules.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices.
- Production Testing of PCB assemblies / Electronics Modules.
- PCB Diagnostic & Repair using In-Circuit Functional testing of High Speed Devices / Microprocessors and Controllers.
- Testing of Board populated with High Pin count Boundary Scan Compatible Devices.
QT2256-320 PXI
Automated Test Equipment (ATE) : QT2256 - 320 PXI - Combination Board Testers
QT2256 - 320 PXI - is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice.
Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides for signal pins, Power (50A each) pins and RF connectors.The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express. It is a modular design with upgrade options. The basic system comes with 128 Universal Pin Drivers, Software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 320 Digital Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Four Analog channels with 12 bit DAC and ADC and 40MHz sampling rate multiplex able to all test channels.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- AC Parametric Tests. - Measurements of Frequency, Pulse Width, Propagation delay, Rise / Fall times.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 12 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 320 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- VPC Mass Interconnect adapter with 16 bit fixture ID, Signal pins, Power and RF Connectors.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
- In-House maintenance wings of Defense Establishments.
- Electronic manufacturing units for Board recovery and Production line testing.
- Transporation sector such as MRTs, Railways, Aircraft, Ships etc.
- Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics
- Complete Repair Station for Third Part Maintenance as a Combinational Board tester.
- Full Board Functional Testing through Card Edge for LRUs (Line Replaceable units).
- As a Bed of Nail In-Circuit Tester in production lines.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices for stringent Quality Control that includes function, DC and AC Parameters.
- Testing of Board populated with a mixture of High Pin count Boundary Scan Compatible Devices and non boundary scan devices.
QT2256-640 PXI
Automated Test Equipment (ATE) : QT2256 - 640 PXI - Combination Board Testers
QT2256 - 320 PXI - is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.It can perform as In –Circuit Device / Cluster test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed. It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 2 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology boundary Scan hardware with RAM based drivers / sensors in synchronization with Automated Test Equipment (ATE) digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System. In-Circuit Emulator Support for testing DSP based Board Function.Parametric Measurement Units (PMU) enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity and Tri-state leakage currents to further enhance fault coverage and avoid unwanted field returns. Optional AC Parametric Tests for propagation delay, rise / fall time and pulse width measurements.
The capabilities can be further enhanced with optional IEEE instrumentation or PXI based Instrumentation and control through TestDirector 6 software. Analog Highways and relay matrix modules are used in routing the test pin to external measurement IEEE or PXI Instruments of user choice.
Uses Virginia Panel Test adapter Interface for highly reliable Unit Under Test (UUT) Interface Panel provides for signal pins, Power (50A each) pins and RF connectors.The ATE is interfaced to an external Host PC using a 32 bit, 33MHz PCI interface card or PCI Express. It is a modular design with upgrade options. The basic system comes with 128 Universal Pin Drivers, Software programmable for High Pin Current Pin Driver or 50 Ohms source impedance, 8 Flying channels 4 Analog channels and 5 fixed UUT power supplies. It can be easily upgraded to 320 Digital Channels and with Programmable UUT power supplies, IEEE or PXI External Instrumentation, Bus Cycle Signature System, ICE and Integrated Boundary Scan Test.
Features :
- Edge Connector Functional Test and Guided Probe Back tracking. Optional Fault coverage report and Fault dictionary.
- In-Circuit Test capability of Digital / Analog / Mixed Signal devices using Force Drive Pin Electronics.
- Four Analog channels with 12 bit DAC and ADC and 40MHz sampling rate multiplex able to all test channels.
- Precision Measurement Units for enhanced fault coverage and reduced field returns.
- DC Parametric Tests. – Measurement of Input Bias Current, Fan out and Tri-State leakage test.
- AC Parametric Tests. - Measurements of Frequency, Pulse Width, Propagation delay, Rise / Fall times.
- Bus Cycle Signature system for CPU Based boards for Learn and Compare digital signatures without having to write TPS.
- Integrated Boundary Scan Test along with ATE pin electronics for Interconnect and functional Test of Non Boundary Scan devices through virtual test pins.
- In-Circuit Emulation Capabilities.
- Integrated PXI Instruments for RF and extended tests.
- External GPIB based Instrument integration.
- Test access through Clips / Probes, bed of nail fixtures, edge connectors and JATG port.
- 4 Digital Highways for measurement of Frequency, Pulse Width, Propagation delay between signals and Rise / Fall time.
- 12 Analog highways of 30MHz band width for connecting terminals of external Instruments to any of the 320 test pins.
- Test Program Migration form Different other Platform to Qmax System.
- Test-Jig adopters for system self-test and calibration.
- Four RF connectors direct from fixture to Instruments without switching.
- VPC Mass Interconnect adapter with 16 bit fixture ID, Signal pins, Power and RF Connectors.
- 5 Data formats for drive edge placement. NRZ, RZ, RO, RZ and SBC.
- Automatic Fault Simulation in Simulator based Test programs.
- Integrated VHDL Simulator as per IEEE standards.
- Paperless Repair Station.
CircuitTracer (Optional)
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Optional Library:Russian Libray / Military Part Code Library.
Boundary Scan Software:: Includes Chain detection, Chain integrity test, Device ID, User ID, Interconnect test in Interacive and additionally Interconnect test between JTAG pins and Physical test pin / edge connector, Functional test for non boundary scan devices in berween JTAG devices and between JTAG and edge connector devices including Guided probe back tracking in advanved Boundary Scan test software. Bus Cycle Signature System (BCSS) Software:Learns DIgital signatures from a known good CPU based board to compare with that of a suspected board to find the fault up to node level in the CPU Kernal, without having to write compex TPS or use of expensive and complex simulation modules for CPUs.
- In-House maintenance wings of Defense Establishments.
- Electronic manufacturing units for Board recovery and Production line testing.
- Transporation sector such as MRTs, Railways, Aircraft, Ships etc.
- Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
- Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics
- Complete Repair Station for Third Part Maintenance as a Combinational Board tester.
- Full Board Functional Testing through Card Edge for LRUs (Line Replaceable units).
- As a Bed of Nail In-Circuit Tester in production lines.
- Inward Goods Inspection for Digital / Analog / Mixed Signal Devices for stringent Quality Control that includes function, DC and AC Parameters.
- Testing of Board populated with a mixture of High Pin count Boundary Scan Compatible Devices and non boundary scan devices.
Boundary Scan Testers - QScan
Qscan is a bench top Test Equipment with USB connectivity to a host PC / Laptop. It is a IEEE 1149 standard Boundary Scan contoller with Dgital and Analog I/O channels. It can be used to test PCBs populated with JTAG compatible devices through a 5 wire JTAG interface and edge connector channelled to the digital and analog I/O pins of the system. It can perform chain detection, Automatic Interconnection test between JTAG devices using virtual test pin concept and also to the edge connectors using the physical test pins of the system. It can also perform edge connector functional test of the entire PCB through powerful software. User can program the test vector using a graphical test pattern editor for both edge pins and JTAG pins thus testing the entire board including non JATG devices in between them. Anlog I/O option cards can be sued to inject analog signals as well as read analog waveforms in synchrnization with the digital patters. Qscan can also be used to digital devices out of circuit using its vast library and ZIF socket adopter.
- IEEE Standard JTAG Test system.
- 32 channel bi-directional I/O pins with programmable drive levels.
- Up to 320 digital I/O Channels.
- Up to 4 Drive / Sense Analog channels.
- Scan Chain Detection.
- User code / Device code verification.
- Interconnect test.
- Board Functional Test.
- Test of Non Boundary Scan Devices using JTAG pins of BS devices and edge connector.
- Test of Mixed Signal and Analog portion of the board using Digital and Analog channels.
- Board Under Test power supply under sofware control.
Out of Circuit Functional Test of Digital Devices - Library. TD6 options.
32 Channel Digital I/O card up to 10 Maximum. 2 Channel Analog card, 2 maximim. Out of Circuit Test Adopters (ZIF Sockets) for testing loose devices.
- Electronic Test and Repair shops.
- Electronic Manufacturing service (EMS) companies.
- R & D Labs.
Functional Test of Latest PCBs with High desity / high pincount devices without having to know what is inside these chips.
QT-PXI-95
QT-95 PXI Is a PXI based Boundary Scan Test controller and I/O channle soffering test solution for latest generation PCBs with high pin count - high density packages such a BGA and others. It uses the IEEE Standard JTAG virtual test pin concept in test access thereby eliminating the need for physical test pins, which is impossible in these latest generation PCBs. The Virtual Test Pin Concept along with edge connector test access eliminates very expensive or impossible bed of nail test fixture and limited channel flying probes. It is designed to provide a test solution for both a board with all Boundary Scan compatible devices or a board with a mixture of Boundary Scan Cmpatible devices and Non Boundary Scan devices. Other than the 4/5 wire JTAG intercae, the system provides Digital and optional Analog I/O Channels as physical test pins that be connected to the edge connector or thrugh a simple low cost test clips / fixtures.
- IEEE stanadrad compliance to 1149.1, 1149.6 and 1532.
- BS Controlled synchronous Digital I/O channels with FIFO memeory for fast speeed of test.
- Basic System controller with 64 channel digital I/O.
- Expandable Digital I/O Channels of 128 channel cards.
- Individually configurable Bi-Directional I/O channels.
- Programmable voltage levels for Digital I/O supporting 1.5V, 1.8V, 2.5V and 3.3V and user programmable.
- Fits in any 3U standrad PXI chassis.
- Software support in Winows Vista / Windows 7.
- PCB Repair shops
- Electronic Manufacturing Service (EMS) companies.
- R&D Labs
- Lab Isntrument in Educational Institutions in teaching Boundary Scan Concepts.
- Automated Board test that has BS devices.
- Diagnosing faults down to componnet level using Boundaru Scan Virtual Test pin concept and a guided probe back tracking.
- Functional test of Flash / RAM / EPROM using virtual test pins.
- Functional test of Non BS devices using virtual test pins f JTAG devices and other physical test pins / edge connectors.
PANTHER-II-HT
PCB Fault Locators - Panther-II-HT Wire Harness Tester
Uses several stimulus modes.
- Fast Force Current - Measure Voltage.
- Force Current - Measure Voltage using PMU for extended range (optional).
- Force Voltage - Measure current (optional).
- AC Stimulus for Contact less testing (optional).
- While simple open / short / diode drop can be detected with fast RCMV chip,additional PMU functions for extend range measurements and AC stimulus for contact less testing possible.
TestMethods
Mode 1: Serial Shift Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device. Five band comparator with 4 bit result code classifies Short / Diode (0.3V) / Diode (0.6V) / Diode (1.2V) / Open, in a single operation.Mode 2: Fixed Reference Method
In this mode, any pin can be made as fixed reference pin and all other pins are tested. Thus for a 14 pin device, 13 test will be carried out keeping any one of the 14 pins as reference. Same pin as reference pin and test pin combination is skipped. The no. of combinations in this mode for 2048 pins are 2047 combinations.Mode 3: Half QSM Method - n*(n-1)/2 combinations
In this mode, all combinations of pins are tested as pair by pair excluding reverse combinations. Same pin as reference pin and test pin combination is skipped. Example, Pin 1 as ref and pin 2 to n are test pins, then pin 2 as ref, pins 3 to n as test pins. The no. of test combinations for this method with 2048 channels are 2 Mega combinations. The current source can be programmed to source or sink or DC / AC Stimulus applied.Mode 4: Full QSM Method - n*(n-1) combinations
In this mode, all combinations of pins are tested as pair by pair including the reverse combinations. Example, Pin 1 as ref and pin 1 to n are test pins, then pin 2 as ref and pins 1 to n as test pins (Same pin as reference pin and test pin combination is skipped). Thus in this mode both normal and reverse polarity combinations are tested automatically. No. of test combinations for 2048 channels will be 4 Mega combinations.Mode 5: RAM Based select sequences (Optional)
In this mode, the required test pin / reference pin addresses have to be filled in the RAM and the tester does only those combinations.No.of Channels
Each Mux card holds 256 channels with 4-wire measurement capability. The present configuration uses 512 channels. It can be upgraded to a maximum of 2048 channels, using 256 channel cards of 8 maximum.Measurement Method
Wire Harness Tester uses 4-wire measurement using fast analog switches for accurate voltage measurements and improves accuracy.Voltage Clamp
Programmable voltage clamp with 14 bit accuracy within 0 to 7.5v. Facilitating accurate voltage clamps as required by user.Time Base
Test Time is programmable from 1us to 256 us in 256 steps (1,2,3,4.. 256). More accurate and flexible test time selection.Wait States
Programmable Wait States from zero to 255 wait states for each test. These can be programmed in the 8 bit Wait State RAM and thus each test combination can have its own wait states to accommodate some pins with capacitance and without affecting the overall test speed.Device pins / fixture wiring with varying capacitance may require either to slow down the test time or selectively insert wait states for those pins only. Slowing down the test time, common for all pins will greatly reduce the tester throughput and increased overall test time. Wire Harness Tester offers RAM based on the fly insertion of wait states for those pin combinations that are capacitive and thus increasing the overall test speed of the system.Compare Threshold
Have four independently programmable compare threshold voltages and 4 comparators to produce 4 bit bar graph (Zone graph) test result. Wire Harness Tester can produce a 4 bit bar graph, thus can detect short / diode 0.3v / diode 0.6v / diode 1.2v / open in a single test.Cable / Wire test: Ohms.Silicon Devices (IC s)(optional): Volts.Compare RAM
Has 4 bit compare RAM for every test combination (4meg x 4 for 2048 channels) and the test results are computed by internal hardware to get instant pass / fail result.Wire Harness Tester offers hardware comparison of learnt and test data by the use of compare RAM. While Learn the test results are stored in a 4 bit Acquisition RAM and also in the 4 bit Compare RAM. In Test mode the compare RAM contents are used to compare with the test results to flag PASS / FAIL status of the results. This feature makes the Test very fast and the test time is just the drive time without software comparison overheads.Mask Bits
Masking comparison for each of the 4 comparators. 4-bit mask helps add test tolerance. e.g. if a test produces a compare output voltage that is just at a compare threshold, the result may be intermittent. Wire Harness Tester provide for masking that comparator to provide a stable and repeatable test results.Acquisition RAM
Has 4-bit acquisition RAM (4MB x 4 bits for 2048 channels) to store the 4 bit bar code test results for each test combination.Acquisition RAM is useful in reading back all the learnt / Test data for FA.First 1024 Error RAM
Has 1024 RAM by 26 bits to store the reference channel address, test channel address and the 4 bit error code for each failure that occurred while in test mode. Once the Test over, the system gives instant result as ALL Test PASSED / Some Test PASSED / All Test FAILED. In addition the system stores up to 1024 first errors in the RAM. If the errors are more than 1024, it flags an overflow bit. This 1024 first errors are normally more than adequate for FA. In case if the user needs all the failure details he can get it from the Acquisition RAM, which is 4 meg deep.| Specifications: | |
|---|---|
| Max Channels | 2048 ( 8 Mux Cards of 256 channels each) |
| Channels per Mux Board | 256 channels standard, 512 channels optional. |
| Clamp Voltage | +/ 5V in 1.2 milli volts step |
| Current Source | +/- 5mA in 0.6uA step, +/- 16mA in 1.9uA step, +/- 50mA in 6uA step |
| Measurement Technique | 4 -Wire Kevin method |
| Voltage Source | 4 Ranges. +/0.2v, +/-0.5v, +/-5v, +/-13v Full Scale Wave shape depends on RAM contents. (100 samples per cycle)(optional). |
| Number of Comparators | 4 |
| Compare Threshold Step | Four Independent Thresholds Each can be between 0-5v in 0.6 mvolts |
| Basic Drive RAM | 24 bits x 1Meg – used only in RAM Sequence Test.8 bits x 1 Meg for 8 bit wait states. 4 bits x 1 Meg Compare Ram.4 bits x 1 Meg Compare Mask bit |
| Expandable Drive RAM | up to 4 Meg. |
| Acquisition RAM | 4Mx8 (4 bit acquisition and 4 bits reserved). |
| Test Result RAM | 1024 X 28 bits (24 bit address and 4 bit fail code) |
| Interface | USB 2.0 |
| Test Modes | Five Modes |
| Time Base | From 1 ms to 256 ms in steps of 1 ms. |
| Wait States | From zero to 255 wait states programmable for each test combination independently combination. |
Specifications:
QT-PXI-25 Specification:
3U cPCI / PXI Platform for rugged Environment Hot Swap (Live Insertion / removal) 4 wire resistance measurementMeasurement range: 200 W, +/- 0.1 W resolution 2 W , +/- 1 mW resolution 200mW, +/- 100 mW resolution.
Complimenting modulated audio tone (optional).
Auto offset capability up to 200 W (optional).
System Specification :
| System | Intel Core Duo T2300(1.66 GHZ) |
| RAM | 512MB DDR2 667MHz |
| HDD | 60GB SATA HDD @5400rpm |
| Operating System | Windows XP Professional Preloaded Monitor : 15 inch TFT Monitor with Touch Screen |
QT100-X
QT100X - Test-Pro Troubleshooter
QT100X is a Desk-Top Entry Level In-Circuit Functional Tester for Test & Repair of populated PCBs. It is capable of testing any 5V Logic device functionally in as wired “in-circuit” condition using vast Qmax device library. No matter, what in-circuit configuration of the device under test is, Qmax’s innovative auto compensation technique modifies the test vector to suit the device configuration on the fly. QT100X uses the back-driving or node-forcing technique to functionally test devices in-circuit. The in-built Auto Guarding Guide helps user to isolate those bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.QT100X also offers QSM VI (Qmax Signature Method - VI) technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI helps to detect ESD induced failures and also enhances fault coverage using Moving Reference technique.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and is stored for future reference. A faulty board of identical type can be compared with the learnt board under Board Test.
QT100X provides the facility to create a visual board layout on the screen.
QT100X has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms, 2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
QT100X offers Resistance, Capacitance, Voltage (RCV) Measurement facility alongwith two channel oscilloscope.
QT100X can be interfaced to any PC with Windows-XP (or higher version) Operating System using USB 2.0.
Key Features
- In-Circuit and Out of Circuit - Digital Functional Testing.
- Auto Guarding – For testing Bus Based devices In-circuit.
- Auto compensation with Qmax Simulator.
- Identify unknown or house coded devices.
- Loop test to isolate intermittently failing devices.
- Automatic Pull-up / down for OC / OE devices.
- Automatic BUT Power Control.
- Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
- Automatic Design Rule Checker for warning on illegal links / configurations of the device under test.
- Capable of testing Analog and Mixed Signal devices out of circuit.
- Logic Analyzer- waveform display for Input / Output Signals.
- Card Edge Testing with optional IDDE Software.
- Board Learn & Board Test Modes.
- QSM VI – an advanced tool for failure analysis.
- Circuit Tracing – For generating net list Information (Optional).
- IDDE - For developing new device program (Optional).
- Built-in Shorts Locator, RCV Measurements & Oscilloscope Functions.
CircuitTracer
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Basic Configuration : 48 digital, 64 QSM Channels.
Expandable : Up to 256 channels for both Digital and QSM Channels.
Expandable : Up to 256 channels for both Digital and QSM Channels.
Applications
- General purpose PCB test and diagnostics.
- Locating shorts across VCC – GND, between PCB tracks, Shorted or partially shorted devices on a bus.
- Testing of customized devices and discrete components using QSM VI.
- Schematic generation using Circuit Trace for un documented PCBs.
User Segments
- Electronic Manufacturing Service (EMS) providers for board recovery.
- Electronic PCB repair shops.
- R & D Labs.
- Educational Institutes in teaching Test Engineering Subject.
QT1100 - Test-Pro Troubleshooter
QT1100 is capable of testing any 5v Logic device functionally in as wired “in-circuit” condition using a huge Vast library that defines the functionality of the device in QDDL hardware description language with pre-defined test vectors. No matter what in-circuit configuration is the device under test is, Qmax’s innovative auto compensation modifies the test vector to suit the device configuration on the fly and its evaluation engine validates each output for the corresponding input present and device functionality. QT1100 uses the back-driving or node-forcing technique to functionally test devices in-circuit. Its Auto Guarding Guide helps user to isolate those Bus devices that could potentially interfere with the Bus Device Under Test. This is also extended to OC / OE devices with wired-OR function.QT1100 also offers QSM VI technique to test custom devices on board that cannot be functionally tested due to lack of information on the functionality. QSM VI captures traces by driving a user Selected current limited sine wave between any two nodes of the DUT and plotting the voltage Vs. current trace. For enhanced fault coverage, QSM VI is capable of capturing traces with any of the DUT pins kept as the reference pin. QSM VI helps detect ESD induced failures.
The Board Learn mode is used to learn the device’s functionality and clip status / link information from a Known Good Board (KGB) and store in a database file for the future use. A faulty board of identical type can be compared with the learnt board using the Board Test Mode, thus increasing the fault coverage. QT1100 provides the facility to create a visual board layout on the screen.
QT1100 has an in-built Short Locator to detect faulty components causing power line shorts or bus line shorts, which cannot be detected using conventional multi-meters. Using the 4-wire measurement technique, it can home-on to the faulty component causing the illegal short. It offers three ranges of measurement at 200 milliOhms2 Ohms and 20 Ohms. The measured resistance value is conveniently displayed as a digital read-out and as a bar graph display.
The built-in Resistance, Capacitance, Voltage (RCV) Measurement mode is capable of measuring RCV values using Probe and Reference pins. QT1100 is also equipped with two channel oscilloscope with maximum sampling rate of 500 KHz. The trigger options include auto, normal, single, positive and negative trigger.
Key Features
- In-Circuit and Out of Circuit - Digital Functional Testing.
- Auto Guarding – For testing Bus Based devices In-circuit.
- Auto compensation with Qmax Simulator.
- Identify unknown or house coded devices.
- Loop test to isolate intermittently failing devices.
- Automatic Pull-up / downs for OC / OE devices.
- Automatic BUT Power Control.
- Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
- Automatic Design Rule Checker for warning on illegal links / configurations of the device under test.
- Capable of testing Analog and Mixed Signal devices out of circuit.
- Logic Analyzer- waveform display for Input / Output Signals.
- Card Edge Testing with optional IDDE Software.
- Board Learn & Board Test Modes.
- QSM VI – an advanced tool for failure analysis.
- Circuit Tracing – For generating net list Information.
- IDDE - For developing New Device Program.
- Built in Shorts Locator.
- RCV Measurements & Oscilloscope Functions built in.
CircuitTracer
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is also an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices.using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is also an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment. There are three modes in this package, namely.
QDDL : Qmax Device Description Language, which is mainly used for generating test program for SSI / MSI devices.using logic primitives and simple commands.
WEST : Waveform Event Specification & Testing is for LSI/VLSI ICs. Test Program generation using WEST requires Training and it is similar to C language.
GTPG : In Graphical Test Program Generation mode the user can directly define the required test input waveforms for the Device Under Test or even for the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.
Basic 48 digital , 64 QSM Channels , expandable up to 128 Channels for both Digital and QSM Channels in QT1100.
Applications
- General purpose PCB test and diagnostics.
- Locating shorts across VCC – GND, between PCB tracks, Shorted or partially shorted devices on a bus.
- Testing of customized devices and discrete components using QSM VI.
- Schematic generation using Circuit Trace for un documented PCBs.
User Segments
- Electronic PCB repair shops.
- Educational Institutes in teaching Test Engineering Subject.
- R & D Labs.
- Electronic Manufacturing Service (EMS) providers for board recovery.
In-Circuit Functional Testers - QT-8200
QT8200 comes with large device library written in QDDL / VHDL and PythonTD languages for In-Circuit and out of Circuit Testing of devices. While testing devices in-circuit, QT8200 employs the auto-compensation technique.When any of the inputs are linked together or connected to the power pins, the drive pattern or Test Vector is modified on the fly depending upon the In-Circuit links of the device under test.
The Qmax simulator simulates the output response on the new modified test vector. This is essential to avoid any clash between the pin drivers driving these pins with different logic levels at the same time.
QT8200 can test any Digital device in in-circuit for its functionality using library defined test patterns. The ICFT mode allows interactive testing of the individual devices, as well as whole board, comprising various devices. Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
QT8200 offers powerful Automatic Guarding Guide, while testing a BUS device such as Tri-state / bidirectional/ O.C. / O.E. device, it is required to guard the device under test by disabling other BUS devices present in the BUT which are on the same BUS.
QT8200 has auto guarding facility which lists the IC and the pins of those devices which may need to be guarded.
Trace Links Wizard makes auto guard list correction much simpler. QT8200 can perform an in-circuit clip-on test for analog devices. Using its three built-in true analog channels, QT8200drives true analog patterns to the input pins and senses the analog voltage at the output pinto give a clear Pass/Fail message. User needs to only clip-on & type in the part number of the device to be tested.
QT8200 has a powerful evaluation engine to test linear devices in-circuit, without the need to learn from a known good board.
QT8200 also offers QSM VI technique to test custom devices passive components on a board which cannot be functionally tested in the ICFT mode. QSM VI takes traces by driving a user defined current limited sine wave between any two nodes of the DUT and plotting the voltage Vs current trace.
Auto “Best Fit Curve” for QSM VI automatic selection of best source impedance, voltage and frequency of the VI stimulus.
RLCV measurements.
Frequency measurement up to 130 MHz.
3 channel Digital Oscilloscope and Function Generator.
Powerful “Board under Test” Power Supplies for testing large ECL boards often requiring 20A and more current.
- In-Circuit Functional testing of digital, analog and mixed Signal Mixed Logic devices of various logic families within +/-12V.
- User programmable Actual test speed on the pin of DUT and it is up to 8 MHz (125 nano seconds).
- High current rating and five voltage output options for the BUT with latest SMPS module (450 watts).
- Qmax Fault Simulation Validated Vast Device Library of 33,200+ western ICs with optional Russian library of 1500+ ICs.
- Windows-based Visual Work Station OR TestDirector 6 software Auto guarding guide using trace links wizard.
- QSM VI - a unique analytical tool to troubleshoot faults on Hybrids / Custom ICs as well as ESD damaged devices.
- Powerful IDDE software to further expand the device library Optional : Fault Simulation Module.
- RLCV measurements.
- Frequency measurement up to 130 MHz.
- 3 channel Digital Oscilloscope and Function Generator.
- Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
- In built Simulator for In-Circuit compensation.
- Dual trace facility for probes and clips.
- Auto Guarding Guide for Bus based devices and OC / OE Devices.
- Logic analyzer waveform display for failure confirmation.
- Identify Unkown and House Coded devices including LSI devices.
- Graphical test program generator for Digital, Analog, Mixed signal devices.
- Mixed logic testing through dual palettes.
- Built in self-diagnostic facility for maintenance.
- Auto / Manual channel mapping facility for board functional test through card edge/fixtures.
- Modular system design for future up-gradation.
- Powerful Sequencer based hardware architecture.
- Automatic internal pull-up/down for open collector and open emitter devices.
- Board Learn/Compare mode results in increased board recovery rate.
- Circuit Tracer for schematic generation / reverse engg. applications (Optional).
- IDDE software for easy Device Test Program Generation (Optional) with Fault coverage report.
- Military part code library.
CircuitTracer (Optional)This optional software package helps the user to trace the intra links between the pins of an IC and also the interlinks between pins of various ICs which can be accessed through appropriate test clips. It automatically generates the Netlists. The Netlist file is then converted to file formats, which are compatible to CAD software packages like ORCAD or EDWIN. This process helps in Reverse Engineering of the PCB i.e. to generate the Schematic Diagram / Circuit Diagram of the Board Under Test.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray / Military Part Code Library.
IDDE is an Optional Software Package which is extremely useful for Device Test Program Generation. IDDE stands for Integrated Device Development Environment using VHDL and PythonTD test languages. Complete with automatic fault simulation nad fault coverage report for every library digital device developed. Also included is GTPG whereuser can directly define the required test input waveforms for the Device Under Test or the entire Board Under Test graphically and if the expected Output waveforms are known to the user the same also can be defined. Otherwise the output from Known Good Board can be learnt and stored as master reference for future comparisons. This mode is extremely useful to test devices / simple boards without any need to write complex test programs.Russian Libray / Military Part Code Library.
Basic 48 Digital Channels expandable up to 96. Basic 48 Anlaog Channels expandable up to 96 / 128 / 256.
- In-house maintenance wings of PSUs.
- Electronic manufacturing units for Board recovery and Production line testing.
- Industries in Automobile, Textiles, Engineering, Steel, Cement sectors for CNC, PLC, electronic PCBs troubleshooting.
- Hi-tech atomic / space labs and R & D labs for maintenance of sophisticated instrumentation / equipment.
- Hospitals for in-house maintenance of Biomedical equipment Electricity generating authorities for maintenance of Control and Instrumentation.
- TPM companies Central Maintenance Centre of Universities, technical educational institutions, Engineering Colleges and Polytechnics.
- Private / Public Sector Units executing Defence Projects.
- Ruggedized version of QT8200 is QT8200M for military applications with camouflage paints.
- Go / No Go Functional Test using edge connectors / bed of nails / clips and probes.
- Small to medium volume production test of devices / Hybrids and PCBs.
- Very general purpose PCB test and diagnostic system with extended features that include all logic families (including ECL), Analog and Mixed signal devices useful for In-House Maintenance and Third party repair of PCBs.
- Custom Test applications such as relay test / hybrid test and device tests.
- PCB Diagnostics and Repair using In-Circuit Functional Test of High speed Devices, Microprocessors and Controllers.
- Inward Goods Inspection (IGI) for Digital / Analog / Mixed Signal ICs Complete Repair Station for Third party Maintenance.
- Production test of Flex Cable Assemblies for Hard Disk / Displays / Cameras.
