FEATURES:
With CATS-100 Trainer in your lab, students
can learn
# To identify and home-on to the problems in the Board under
test, due to
a. Board
Related failure (Solder bridges / track opens / shorts)
b. IC Related failure (Linear
/ digital / custom ICs)
c. Component Related
failure (Discrete / custom components)
# To save the vital data from known good board and to compare
with the faulty board, to isolate and solve the problem.
# To graphically compare the input signal, expected output signal
and actual output signal using in-built logic analyser waveform display
function.
# To test custom devices / ICs / unknown ICs / house coded ICs
using V-I Impedance Graph Technique.
# To test a cluster of devices or to test a board at one stroke
through edge connector of the PCB, for its integrity (Optional)
# To program test routines for new devices and add it in the
library.
# To locate shorts on the board using in-built short circuit
locator (4 wire resistance measurement technique) for isolating fan-out
problems and Vcc / Gnd Shorts.
SPECIFICATIONS:
Digital Test Capabilities
Drive / Sense Channels - 48 channels.
Drive / Sink capability
- 220 mA per channel. Fixed drive levels
for zero, tristate and +5v.
Sense Threshold - Programmable from 0v to 5.12v in steps of 20mv / step.
RAM behind each drive
- 8k x 2 RAM.
Test Speed - Programmable from a maximum of 2 micro seconds to
512 micro seconds per tick in 9 steps.
Guard Channel - 8 channels programmable to 0v, 5v or Tristate.
Library - TTL, CMOS, INTERFACE, LSI, VLSI, Analog devices and
User libraries.
Diagnostic software -
Qmax CATS-100 software runs under MS-Windows
'95.
Test Language - Qmax CATS-100 IDDE software with QDDL, WEST and GTPG.
DUT power supply - +/- 5v @ 20 amps Auto Switch on/off under program
control.
Functions - Power on In-circuit Functional Test, Unknown Device
identify, Automatic Circuit compensation, Automatic pull up for open collector
Testing, Board Learn / Test functions with auto guarding guide, Board Functional
test through card edge, Cluster testing, User expandable test library, In-circuit
Resistor / Capacitance measurement. Power on pin status indication for pin
Floats, Links, Voltages and impedance, Logic Analyser waveform display,
clear PASS / FAIL indication for ease of use, Variable Test Speed, Circuit
Tracer function, Integrated Testing of ICFT, QSM / VI in one operation.
Analog Test Capabilities
Drive / Sense Channels
- 2 Analog channels to any of the 48 channels
and 2 sets of movable probe.
Drive / Sense Capability
- +/- 10mA max; +/- 32v max.
RAM behind channels -
8k x 8 bits each drive and sense channels.
Data Rate - 2 micro seconds per tick to 16 milli seconds per tick
in steps.
Drive pattern - Sine, Ramp, Triangle, Square or user definable.
Functions - Functional Test for Op-Amps, Comparators, Transistors,
SCR, FETS in Out-Circuit mode.
QSM & VI Trace
Channels - 64 Channels.
Probes - 2 probes with 2 reference signals inputs for QSM.
Voltage range - .
+/- 2.5v, +/- 8v, +/- 19v, +/- 32v. Current range from 0.24mA to max. of
10mA.
Frequencies - 40 Hz, 312 Hz, 2.5 KHz.
Drive pattern - Sine or as required.
Function - QSM, VI, Impedance and Voltage measurements.
Short Locator
Ranges - 3 Ranges at 200 milli ohms, 2 ohms and 200 ohms using
4 wire measurements.
Resolution - 800 micro ohms in 200 milli ohms range.
Display - Bar Graph, Digital readout and Audible sound.
