|
|
QNimits
Key Features :
Unique Trouble-shooting Tool
Nodal Impedance Test
Save & Compare Facility
Data Transfer to PC through USB Port
In-built Color LCD TFT Screen
Truly Portable Unit
Ideal for :
Electronics Repair Shops
Field Engineers & Technicians
In-house or Third Party Service Centres
|
|
Recovery of Failed Boards in Manufacturing Process
Today’s PCBs are so complex in nature and with more of proprietary devices.
In most cases the schematics and internal functional details are un available for third
party maintenance personnel.
Thus diagnosing faults in such PCBs are difficult task using conventional test instruments
such as multimeter or oscilloscope that are normally found in repair shops.
Advancements in Semi-conductor technology and reliability has resulted in very few or
nil failures in silicon wafers and if even they fail, it is only attributed to external forces
which damages the I/O pins of such devices thus causing a board fault.
|
|
|
QNimits
QNImits is an innovative hand held test instrument which uses the industry’s proven V-I Trace
technique of learn and compare of Nodal impedances.
Using this technique the technician only requires a known good board for comparison with a
faulty one without having the need of schematics and functional details of such PCBs.
The known good board’s VI traces can be learnt and stored for future reference as well.
QNImits uses probe – reference (usually Ground) to either on-line (side by side)
comparison of each node or alternatively uses external MUX switch and clips / adopters for
multi-pin learn and compare.
QNimits, displays the test results as VI trace which shows the current against applied
voltage in most commonly used graphical view.
These trace formats help the user to easily understand the nodal behavior and interpret the
results for quick diagnostics.
Using V-I curve traces one can detect a change in devices’ pin characteristics due to aging or
damage caused by external forces such as lighting, static discharge or short circuit / over
current damages.QSM VI mode uses all pins of the device as reference and hence able to detect leakages
between pins as well.
Alongwith QNimits the user can order the optional test clips/ test interface accessories
as required and learn the analog VI traces of all the pins (without having to know the circuit
diagram) of an IC on a Known Good Board and then compare with a bad board.
|
|
|
QNimits
This test technique works most of the time, because most of the failing devices shows a
different response to VI trace unless there is no terminal failure.
The USB interface which comes as standard with QNImits helps in connecting to PC/AT or
Lap top so that signature information learnt from Known Good Board can be saved for
further verification and analysis.
The Qmax QNimits will be an invaluable tool in any electronic service Center.
|
Specifications
Fully user programmable VI trace drive patterns
(Sine, Square, Saw-tooth and User defined patterns)
Frequency from DC to 100 KHz
Source Impedence 100 Ohms, 1KOhms, 10KOhms, 100KOhms and 1 MOhms.
Voltage selection : 1.5V, 3V, 6V and 12V
USB 2.0 interface to transfer data to host system
Optional external interface to test semi-con devices
Hand-held with 3.2” TFT Screen (320 X 240 pixels)
User-friendly keypad
Power : Battery operated or through AC adapter
|
|
|
|
|